{"created":"2021-03-01T06:12:31.293927+00:00","id":5935,"links":{},"metadata":{"_buckets":{"deposit":"ef4c525e-97f1-4c83-afea-6c263fe0a8c0"},"_deposit":{"id":"5935","owners":[],"pid":{"revision_id":0,"type":"depid","value":"5935"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00005935","sets":["367:368:369:736"]},"author_link":["15768","15769","15770","15771","15772","15773","15774","15775","15776","15777"],"item_1615768549627":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_9_alternative_title_19":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Quantitative chemical analysis of rocks with X-ray fluorescence analyzer XRF-1800","subitem_alternative_title_language":"en"}]},"item_9_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004-12-25","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"91","bibliographicPageStart":"79","bibliographicVolumeNumber":"20","bibliographic_titles":[{"bibliographic_title":"名古屋大学博物館報告","bibliographic_titleLang":"ja"}]}]},"item_9_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper describes analytical procedures to determine 10 major and 15 trace elements in silicate rocks, using an X-ray fluorescence analyzer (Shimadzu SFX 1800) with a Rh target at the Center for Chronological Research, Nagoya University. Analyses are carried out on glass bead prepared through fusion of sample and flux (Li2B4O7) mixture in the proportion of 0.7g : 6.0g for major elements (Si, Ti, Al, Fe, Mn, Mg, Ca, Na, K, P) and 2g : 3g for trace elements (V, Cr, Co, Ni, Cu, Zn, As, Rb, Sr, Y, Zr, Nb, Ba, Pb,Th). Calibration curves for the major elements cover a wide compositional range of igneous, metamorphic and sedimentary silicate rocks. Calibration curves for the trace elements are corrected for spectral line-overlap and matrix effect, and carry out reliable analyses at concentration above 2-10ppm.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_9_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"国立情報学研究所で電子化したコンテンツを使用している。","subitem_description_language":"ja","subitem_description_type":"Other"}]},"item_9_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/7548"}]},"item_9_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.18999/bulnum.020.07","subitem_identifier_reg_type":"JaLC"}]},"item_9_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"名古屋大学博物館","subitem_publisher_language":"ja"}]},"item_9_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_9_source_id_7":{"attribute_name":"ISSN（print）","attribute_value_mlt":[{"subitem_source_identifier":"13468286","subitem_source_identifier_type":"PISSN"}]},"item_9_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"中崎, 峰子","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"15768","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"壷井, 基裕","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"15769","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"金川, 和世","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"15770","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"加藤, 丈典","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"15771","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"鈴木, 和博","creatorNameLang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"15772","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nakazaki, Mineko","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"15773","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tsuboi, Motohiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"15774","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kanagawa, Kazuyo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"15775","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Katou, Takenori","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"15776","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Suzuki, Kazuhiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"15777","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-19"}],"displaytype":"detail","filename":"79.pdf","filesize":[{"value":"1.1 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"79.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/5935/files/79.pdf"},"version_id":"acd9fcee-ae6b-482b-9160-deee37f6a0ec"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"X線分析装置XRF-1800による岩石の定量化学分析","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"X線分析装置XRF-1800による岩石の定量化学分析","subitem_title_language":"ja"}]},"item_type_id":"9","owner":"1","path":["736"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2007-04-03"},"publish_date":"2007-04-03","publish_status":"0","recid":"5935","relation_version_is_last":true,"title":["X線分析装置XRF-1800による岩石の定量化学分析"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T03:50:34.319134+00:00"}