{"created":"2021-03-01T06:12:45.162734+00:00","id":6154,"links":{},"metadata":{"_buckets":{"deposit":"eadae011-9d56-42f9-b9a8-e3fab5ab30f1"},"_deposit":{"id":"6154","owners":[],"pid":{"revision_id":0,"type":"depid","value":"6154"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00006154","sets":["320:502:503"]},"author_link":["16600","16601","16602","16603"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2003-03","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{"bibliographic_title":"Preceedings of ISPLC2003","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This manuscript reports the results of the measurement of wide-band PLC noise with high speed (50MHz) sampling and long (10.4s) observation duration. The measured noise is divided in frequency, and stochastic properties of the noise waveforms in each frequency bands, such as autocorrelations, probability density functions, and correlation coeeficients between noise waveforms of different frequency bands are discussed. Cyclostationary features of the noise in each band is confirmed. It is found that the amplitude distribution in each band is different, and that Gaussian noise model is not a good approximation in higher frequency bands.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/7792"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE","subitem_publisher_language":"en"}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 2003 IEEE. Reprinted from Preceedings of ISPLC2003. 2003.This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Hirayama, Yuichi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"16600","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Okada, Hiraku","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"16601","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yamazato, Takaya","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"16602","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Katayama, Masaaki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"16603","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-19"}],"displaytype":"detail","filename":"isplc-1.pdf","filesize":[{"value":"1.8 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"isplc-1.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/6154/files/isplc-1.pdf"},"version_id":"51762f6d-0ce6-4dc4-ba52-5bd5ad7331ba"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Noise Analysis on Wide-Band PLC with High Sampling Rate and Long Observation Time","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Noise Analysis on Wide-Band PLC with High Sampling Rate and Long Observation Time","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["503"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2007-05-16"},"publish_date":"2007-05-16","publish_status":"0","recid":"6154","relation_version_is_last":true,"title":["Noise Analysis on Wide-Band PLC with High Sampling Rate and Long Observation Time"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T03:50:50.057110+00:00"}