{"created":"2021-03-01T06:13:44.103135+00:00","id":7094,"links":{},"metadata":{"_buckets":{"deposit":"4cef58e3-92a8-44dd-93da-f59a51270f55"},"_deposit":{"id":"7094","owners":[],"pid":{"revision_id":0,"type":"depid","value":"7094"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:00007094","sets":["320:321:322"]},"author_link":["19154","19155","19156","19157","19158"],"item_10_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006-10-09","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"15","bibliographicPageEnd":"153502","bibliographicPageStart":"153502","bibliographicVolumeNumber":"89","bibliographic_titles":[{"bibliographic_title":"APPLIED PHYSICS LETTERS","bibliographic_titleLang":"en"}]}]},"item_10_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The authors have performed a depth-profile analysis of an all-oxide p-n junction diode n-ZnO/ p-NiO using photoemission spectroscopy combined with Ar-ion sputtering. Systematic core-level shifts were observed during the gradual removal of the ZnO overlayer, and were interpreted using a model based on charge conservation. Spatial profile of the potential around the interface was deduced, including the charge-depletion width of 2.3 nm extending on the ZnO side and the built-in potential of 0.54 eV.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10_identifier_60":{"attribute_name":"URI","attribute_value_mlt":[{"subitem_identifier_type":"HDL","subitem_identifier_uri":"http://hdl.handle.net/2237/8768"}]},"item_10_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Institute of Physics","subitem_publisher_language":"en"}]},"item_10_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1063/1.2358858","subitem_relation_type_select":"DOI"}}]},"item_10_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (2006) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.","subitem_rights_language":"en"}]},"item_10_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"publisher"}]},"item_10_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0003-6951","subitem_source_identifier_type":"PISSN"}]},"item_10_text_14":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_text_value":"application/pdf"}]},"item_1615787544753":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Ishida, Yukiaki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"19154","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Fujimori, Atsushi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"19155","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ohta, Hiromichi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"19156","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hirano, Masahiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"19157","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hosono, Hideo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"19158","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-02-19"}],"displaytype":"detail","filename":"AppPhysLett_89-153502.pdf","filesize":[{"value":"926.3 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"AppPhysLett_89-153502.pdf","objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/7094/files/AppPhysLett_89-153502.pdf"},"version_id":"8c4b268a-56ad-491d-ac24-982ff595cc95"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Potential profiling of the nanometer-scale charge-depletion layer in n-ZnO/p-NiO junction using photoemission spectroscopy","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Potential profiling of the nanometer-scale charge-depletion layer in n-ZnO/p-NiO junction using photoemission spectroscopy","subitem_title_language":"en"}]},"item_type_id":"10","owner":"1","path":["322"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2007-09-21"},"publish_date":"2007-09-21","publish_status":"0","recid":"7094","relation_version_is_last":true,"title":["Potential profiling of the nanometer-scale charge-depletion layer in n-ZnO/p-NiO junction using photoemission spectroscopy"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-01-16T03:52:33.542849+00:00"}