{"_buckets": {"deposit": "cfe7c731-c88e-4190-8e59-48fb62ca7317"}, "_deposit": {"id": "12429", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "12429"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00012429", "sets": ["675"]}, "author_link": ["39202", "39203", "39204", "39205"], "item_10_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2008-02", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "1", "bibliographicPageEnd": "35", "bibliographicPageStart": "27", "bibliographicVolumeNumber": "14", "bibliographic_titles": [{"bibliographic_title": "Microscopy and Microanalysis", "bibliographic_titleLang": "en"}]}]}, "item_10_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "We propose a simple and practical solution to remove artificial contrast inhibiting direct interpretation of atomic arrangements in aberration-corrected TEM. The method is based on a combination of “image subtraction” for elimination of nonlinear components in images and newly improved “image deconvolution” for proper compensation of nonflat phase contrast transfer function. The efficiency of the method is shown by experimental and simulation data of typical materials such as gold, silicon, and magnesium oxide. The hypothetical results from further improvements of TEM instruments are also simulated. It is concluded that we can approach actual atomic structures by using the present method, that is, a proper combination of a Cs corrector, image subtraction, and image deconvolution processes.", "subitem_description_language": "en", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/14314"}, {"subitem_identifier_type": "DOI", "subitem_identifier_uri": "http://dx.doi.org/10.1017/S1431927608080173"}]}, "item_10_publisher_32": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "Cambridge University Press", "subitem_publisher_language": "en"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://doi.org/10.1017/S1431927608080173", "subitem_relation_type_select": "DOI"}}]}, "item_10_rights_12": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Cambridge University Press", "subitem_rights_language": "en"}]}, "item_10_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "1431-9276", "subitem_source_identifier_type": "PISSN"}]}, "item_1615787544753": {"attribute_name": "出版タイプ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "open access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_abf2"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Yamasaki, Jun", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "39202", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kawai, Tomoyuki", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "39203", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kondo, Yushi", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "39204", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Tanaka, Nobuo", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "39205", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-20"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "download3.pdf", "filesize": [{"value": "649.6 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_note", "mimetype": "application/pdf", "size": 649600.0, "url": {"label": "download3.pdf", "objectType": "fulltext", "url": "https://nagoya.repo.nii.ac.jp/record/12429/files/download3.pdf"}, "version_id": "8f5f8e78-cd81-4873-98e8-bd02550e3043"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "Aberration-corrected TEM", "subitem_subject_scheme": "Other"}, {"subitem_subject": "nonlinear component", "subitem_subject_scheme": "Other"}, {"subitem_subject": "image subtraction", "subitem_subject_scheme": "Other"}, {"subitem_subject": "image deconvolution", "subitem_subject_scheme": "Other"}, {"subitem_subject": "artificial image contrast", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Cs-corrected TEM", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "A Practical Solution for Eliminating Artificial Image Contrast in Aberration-Corrected TEM", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "A Practical Solution for Eliminating Artificial Image Contrast in Aberration-Corrected TEM", "subitem_title_language": "en"}]}, "item_type_id": "10", "owner": "1", "path": ["675"], "permalink_uri": "http://hdl.handle.net/2237/14314", "pubdate": {"attribute_name": "PubDate", "attribute_value": "2010-11-22"}, "publish_date": "2010-11-22", "publish_status": "0", "recid": "12429", "relation": {}, "relation_version_is_last": true, "title": ["A Practical Solution for Eliminating Artificial Image Contrast in Aberration-Corrected TEM"], "weko_shared_id": -1}