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A Practical Solution for Eliminating Artificial Image Contrast in Aberration-Corrected TEM
http://hdl.handle.net/2237/14314
http://hdl.handle.net/2237/14314302084c2-86da-4dd6-9510-4bb04c670658
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
download3.pdf (649.6 kB)
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| Item type | 学術雑誌論文 / Journal Article(1) | |||||
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| 公開日 | 2010-11-22 | |||||
| タイトル | ||||||
| タイトル | A Practical Solution for Eliminating Artificial Image Contrast in Aberration-Corrected TEM | |||||
| 言語 | en | |||||
| 著者 |
Yamasaki, Jun
× Yamasaki, Jun× Kawai, Tomoyuki× Kondo, Yushi× Tanaka, Nobuo |
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| アクセス権 | ||||||
| アクセス権 | open access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_abf2 | |||||
| 権利 | ||||||
| 言語 | en | |||||
| 権利情報 | Cambridge University Press | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Aberration-corrected TEM | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | nonlinear component | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | image subtraction | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | image deconvolution | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | artificial image contrast | |||||
| キーワード | ||||||
| 主題Scheme | Other | |||||
| 主題 | Cs-corrected TEM | |||||
| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | We propose a simple and practical solution to remove artificial contrast inhibiting direct interpretation of atomic arrangements in aberration-corrected TEM. The method is based on a combination of “image subtraction” for elimination of nonlinear components in images and newly improved “image deconvolution” for proper compensation of nonflat phase contrast transfer function. The efficiency of the method is shown by experimental and simulation data of typical materials such as gold, silicon, and magnesium oxide. The hypothetical results from further improvements of TEM instruments are also simulated. It is concluded that we can approach actual atomic structures by using the present method, that is, a proper combination of a Cs corrector, image subtraction, and image deconvolution processes. | |||||
| 言語 | en | |||||
| 出版者 | ||||||
| 出版者 | Cambridge University Press | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| 出版タイプ | ||||||
| 出版タイプ | VoR | |||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
| DOI | ||||||
| 関連タイプ | isVersionOf | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | https://doi.org/10.1017/S1431927608080173 | |||||
| ISSN | ||||||
| 収録物識別子タイプ | PISSN | |||||
| 収録物識別子 | 1431-9276 | |||||
| 書誌情報 |
en : Microscopy and Microanalysis 巻 14, 号 1, p. 27-35, 発行日 2008-02 |
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| 著者版フラグ | ||||||
| 値 | publisher | |||||
| URI | ||||||
| 識別子 | http://hdl.handle.net/2237/14314 | |||||
| 識別子タイプ | HDL | |||||
| URI | ||||||
| 識別子 | http://dx.doi.org/10.1017/S1431927608080173 | |||||
| 識別子タイプ | DOI | |||||
