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  1. F200 未来材料・システム研究所
  2. F200a 雑誌掲載論文
  3. 学術雑誌

A Practical Solution for Eliminating Artificial Image Contrast in Aberration-Corrected TEM

http://hdl.handle.net/2237/14314
http://hdl.handle.net/2237/14314
302084c2-86da-4dd6-9510-4bb04c670658
名前 / ファイル ライセンス アクション
download3.pdf download3.pdf (649.6 kB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2010-11-22
タイトル
タイトル A Practical Solution for Eliminating Artificial Image Contrast in Aberration-Corrected TEM
言語 en
著者 Yamasaki, Jun

× Yamasaki, Jun

WEKO 39202

en Yamasaki, Jun

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Kawai, Tomoyuki

× Kawai, Tomoyuki

WEKO 39203

en Kawai, Tomoyuki

Search repository
Kondo, Yushi

× Kondo, Yushi

WEKO 39204

en Kondo, Yushi

Search repository
Tanaka, Nobuo

× Tanaka, Nobuo

WEKO 39205

en Tanaka, Nobuo

Search repository
アクセス権
アクセス権 open access
アクセス権URI http://purl.org/coar/access_right/c_abf2
権利
言語 en
権利情報 Cambridge University Press
キーワード
主題Scheme Other
主題 Aberration-corrected TEM
キーワード
主題Scheme Other
主題 nonlinear component
キーワード
主題Scheme Other
主題 image subtraction
キーワード
主題Scheme Other
主題 image deconvolution
キーワード
主題Scheme Other
主題 artificial image contrast
キーワード
主題Scheme Other
主題 Cs-corrected TEM
抄録
内容記述 We propose a simple and practical solution to remove artificial contrast inhibiting direct interpretation of atomic arrangements in aberration-corrected TEM. The method is based on a combination of “image subtraction” for elimination of nonlinear components in images and newly improved “image deconvolution” for proper compensation of nonflat phase contrast transfer function. The efficiency of the method is shown by experimental and simulation data of typical materials such as gold, silicon, and magnesium oxide. The hypothetical results from further improvements of TEM instruments are also simulated. It is concluded that we can approach actual atomic structures by using the present method, that is, a proper combination of a Cs corrector, image subtraction, and image deconvolution processes.
言語 en
内容記述タイプ Abstract
出版者
言語 en
出版者 Cambridge University Press
言語
言語 eng
資源タイプ
資源タイプresource http://purl.org/coar/resource_type/c_6501
タイプ journal article
出版タイプ
出版タイプ VoR
出版タイプResource http://purl.org/coar/version/c_970fb48d4fbd8a85
DOI
関連タイプ isVersionOf
識別子タイプ DOI
関連識別子 https://doi.org/10.1017/S1431927608080173
ISSN
収録物識別子タイプ PISSN
収録物識別子 1431-9276
書誌情報 en : Microscopy and Microanalysis

巻 14, 号 1, p. 27-35, 発行日 2008-02
著者版フラグ
値 publisher
URI
識別子 http://hdl.handle.net/2237/14314
識別子タイプ HDL
URI
識別子 http://dx.doi.org/10.1017/S1431927608080173
識別子タイプ DOI
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