{"_buckets": {"deposit": "3eb28924-da5f-46f0-a842-c823326cae3d"}, "_deposit": {"id": "13134", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "13134"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00013134"}, "item_10_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2007-01-01", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "1", "bibliographicPageEnd": "295", "bibliographicPageStart": "288", "bibliographicVolumeNumber": "E90-D", "bibliographic_titles": [{"bibliographic_title": "IEICE transactions on information and systems"}]}]}, "item_10_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "A tri-template-based codes (TTBC) method is proposed to reduce test cost of intellectual property (IP) cores. In order to reduce test data volume (TDV), the approach utilizes three templates, i.e., all 0, all 1, and the previously applied test data, for generating the subsequent test data by flipping the inconsistent bits. The approach employs a small number of test channels I to supply a large number of internal scan chains 2I-3 such that it can achieve significant reduction in test application time (TAT). Furthermore, as a non-intrusive and automatic test pattern generation (ATPG) independent solution, the approach is suitable for IP core testing because it requires neither redesign of the core under test (CUT) nor running any additional ATPG for the encoding procedure. In addition, the decoder has low hardware overhead, and its design is independent of the CUT and the given test set. Theoretical analysis and experimental results for ISCAS 89 benchmark circuits have proven the efficiency of the proposed approach.", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "URI", "subitem_identifier_uri": "http://www.ieice.org/jpn/trans_online/index.html"}, {"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/15029"}]}, "item_10_publisher_32": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "Institute of Electronics, Information and Communication Engineers"}]}, "item_10_rights_12": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "Copyright (C) 2007 IEICE"}]}, "item_10_select_15": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0916-8532", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "ZENG, Gang"}], "nameIdentifiers": [{"nameIdentifier": "41361", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "ITO, Hideo"}], "nameIdentifiers": [{"nameIdentifier": "41362", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-20"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "236.pdf", "filesize": [{"value": "487.8 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 487800.0, "url": {"label": "236.pdf", "url": "https://nagoya.repo.nii.ac.jp/record/13134/files/236.pdf"}, "version_id": "71165d76-3e2f-4bc4-82b9-0078c68f921b"}]}, "item_keyword": {"attribute_name": "\u30ad\u30fc\u30ef\u30fc\u30c9", "attribute_value_mlt": [{"subitem_subject": "design for testability", "subitem_subject_scheme": "Other"}, {"subitem_subject": "IP core testing", "subitem_subject_scheme": "Other"}, {"subitem_subject": "test cost reduction", "subitem_subject_scheme": "Other"}, {"subitem_subject": "test data compression", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Low-Cost IP Core Test Using Tri-Template-Based Codes", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Low-Cost IP Core Test Using Tri-Template-Based Codes"}]}, "item_type_id": "10", "owner": "1", "path": ["312/313/314"], "permalink_uri": "http://hdl.handle.net/2237/15029", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_name_i18n": "\u516c\u958b\u65e5", "attribute_value": "2011-07-05"}, "publish_date": "2011-07-05", "publish_status": "0", "recid": "13134", "relation": {}, "relation_version_is_last": true, "title": ["Low-Cost IP Core Test Using Tri-Template-Based Codes"], "weko_shared_id": null}