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{"_buckets": {"deposit": "3eb28924-da5f-46f0-a842-c823326cae3d"}, "_deposit": {"id": "13134", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "13134"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00013134", "sets": ["314"]}, "author_link": ["41361", "41362"], "item_10_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2007-01-01", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "1", "bibliographicPageEnd": "295", "bibliographicPageStart": "288", "bibliographicVolumeNumber": "E90-D", "bibliographic_titles": [{"bibliographic_title": "IEICE transactions on information and systems", "bibliographic_titleLang": "en"}]}]}, "item_10_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "A tri-template-based codes (TTBC) method is proposed to reduce test cost of intellectual property (IP) cores. In order to reduce test data volume (TDV), the approach utilizes three templates, i.e., all 0, all 1, and the previously applied test data, for generating the subsequent test data by flipping the inconsistent bits. The approach employs a small number of test channels I to supply a large number of internal scan chains 2I-3 such that it can achieve significant reduction in test application time (TAT). Furthermore, as a non-intrusive and automatic test pattern generation (ATPG) independent solution, the approach is suitable for IP core testing because it requires neither redesign of the core under test (CUT) nor running any additional ATPG for the encoding procedure. In addition, the decoder has low hardware overhead, and its design is independent of the CUT and the given test set. Theoretical analysis and experimental results for ISCAS 89 benchmark circuits have proven the efficiency of the proposed approach.", "subitem_description_language": "en", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "URI", "subitem_identifier_uri": "http://www.ieice.org/jpn/trans_online/index.html"}, {"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/15029"}]}, "item_10_publisher_32": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "Institute of Electronics, Information and Communication Engineers", "subitem_publisher_language": "en"}]}, "item_10_relation_43": {"attribute_name": "関連情報", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "http://www.ieice.org/jpn/trans_online/index.html", "subitem_relation_type_select": "URI"}}]}, "item_10_rights_12": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright (C) 2007 IEICE", "subitem_rights_language": "en"}]}, "item_10_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0916-8532", "subitem_source_identifier_type": "PISSN"}]}, "item_1615787544753": {"attribute_name": "出版タイプ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "open access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_abf2"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "ZENG, Gang", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "41361", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "ITO, Hideo", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "41362", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-20"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "236.pdf", "filesize": [{"value": "487.8 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_note", "mimetype": "application/pdf", "size": 487800.0, "url": {"label": "236.pdf", "objectType": "fulltext", "url": "https://nagoya.repo.nii.ac.jp/record/13134/files/236.pdf"}, "version_id": "71165d76-3e2f-4bc4-82b9-0078c68f921b"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "design for testability", "subitem_subject_scheme": "Other"}, {"subitem_subject": "IP core testing", "subitem_subject_scheme": "Other"}, {"subitem_subject": "test cost reduction", "subitem_subject_scheme": "Other"}, {"subitem_subject": "test data compression", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Low-Cost IP Core Test Using Tri-Template-Based Codes", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Low-Cost IP Core Test Using Tri-Template-Based Codes", "subitem_title_language": "en"}]}, "item_type_id": "10", "owner": "1", "path": ["314"], "permalink_uri": "http://hdl.handle.net/2237/15029", "pubdate": {"attribute_name": "PubDate", "attribute_value": "2011-07-05"}, "publish_date": "2011-07-05", "publish_status": "0", "recid": "13134", "relation": {}, "relation_version_is_last": true, "title": ["Low-Cost IP Core Test Using Tri-Template-Based Codes"], "weko_shared_id": -1}
  1. A500 情報学部/情報学研究科・情報文化学部・情報科学研究科
  2. A500a 雑誌掲載論文
  3. 学術雑誌

Low-Cost IP Core Test Using Tri-Template-Based Codes

http://hdl.handle.net/2237/15029
http://hdl.handle.net/2237/15029
3197f1af-1aba-49eb-8960-9d400b700564
名前 / ファイル ライセンス アクション
236.pdf 236.pdf (487.8 kB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2011-07-05
タイトル
タイトル Low-Cost IP Core Test Using Tri-Template-Based Codes
言語 en
著者 ZENG, Gang

× ZENG, Gang

WEKO 41361

en ZENG, Gang

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ITO, Hideo

× ITO, Hideo

WEKO 41362

en ITO, Hideo

Search repository
アクセス権
アクセス権 open access
アクセス権URI http://purl.org/coar/access_right/c_abf2
権利
言語 en
権利情報 Copyright (C) 2007 IEICE
キーワード
主題Scheme Other
主題 design for testability
キーワード
主題Scheme Other
主題 IP core testing
キーワード
主題Scheme Other
主題 test cost reduction
キーワード
主題Scheme Other
主題 test data compression
抄録
内容記述 A tri-template-based codes (TTBC) method is proposed to reduce test cost of intellectual property (IP) cores. In order to reduce test data volume (TDV), the approach utilizes three templates, i.e., all 0, all 1, and the previously applied test data, for generating the subsequent test data by flipping the inconsistent bits. The approach employs a small number of test channels I to supply a large number of internal scan chains 2I-3 such that it can achieve significant reduction in test application time (TAT). Furthermore, as a non-intrusive and automatic test pattern generation (ATPG) independent solution, the approach is suitable for IP core testing because it requires neither redesign of the core under test (CUT) nor running any additional ATPG for the encoding procedure. In addition, the decoder has low hardware overhead, and its design is independent of the CUT and the given test set. Theoretical analysis and experimental results for ISCAS 89 benchmark circuits have proven the efficiency of the proposed approach.
言語 en
内容記述タイプ Abstract
出版者
言語 en
出版者 Institute of Electronics, Information and Communication Engineers
言語
言語 eng
資源タイプ
資源タイプresource http://purl.org/coar/resource_type/c_6501
タイプ journal article
出版タイプ
出版タイプ VoR
出版タイプResource http://purl.org/coar/version/c_970fb48d4fbd8a85
関連情報
関連タイプ isVersionOf
識別子タイプ URI
関連識別子 http://www.ieice.org/jpn/trans_online/index.html
ISSN
収録物識別子タイプ PISSN
収録物識別子 0916-8532
書誌情報 en : IEICE transactions on information and systems

巻 E90-D, 号 1, p. 288-295, 発行日 2007-01-01
著者版フラグ
値 publisher
URI
識別子 http://www.ieice.org/jpn/trans_online/index.html
識別子タイプ URI
URI
識別子 http://hdl.handle.net/2237/15029
識別子タイプ HDL
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