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  1. B200 工学部/工学研究科
  2. B200a 雑誌掲載論文
  3. 学術雑誌

Grazing-incidence electron microscopy of surface blisters in single- and polycrystalline tungsten formed by H+, D+ and He+ irradiation

http://hdl.handle.net/2237/20787
http://hdl.handle.net/2237/20787
e24aec7a-a826-4663-b55c-e617e6609fff
名前 / ファイル ライセンス アクション
JNM-D-08-00137_1.pdf JNM-D-08-00137_1.pdf (2.4 MB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2014-11-17
タイトル
タイトル Grazing-incidence electron microscopy of surface blisters in single- and polycrystalline tungsten formed by H+, D+ and He+ irradiation
言語 en
著者 Enomoto, Naruaki

× Enomoto, Naruaki

WEKO 54480

en Enomoto, Naruaki

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Muto, Shunsuke

× Muto, Shunsuke

WEKO 54481

en Muto, Shunsuke

Search repository
Tanabe, Tetsuo

× Tanabe, Tetsuo

WEKO 54482

en Tanabe, Tetsuo

Search repository
Davis, J.W.

× Davis, J.W.

WEKO 54483

en Davis, J.W.

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Haasz, A.A.

× Haasz, A.A.

WEKO 54484

en Haasz, A.A.

Search repository
アクセス権
アクセス権 open access
アクセス権URI http://purl.org/coar/access_right/c_abf2
権利
言語 en
権利情報 This is the author's version of a work that was accepted for publication in Journal of Nuclear Materials. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms, may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Journal of Nuclear Materials. v.385, n.3, 2009, p.606–614, DOI:10.1016/j.jnucmat.2009.01.298.
抄録
内容記述 Blisters on single- and polycrystalline tungsten surfaces formed by hydrogen and helium ion irradiation were investigated by grazing-incidence electron microscopy (GIEM) with an ultra-high-voltage transmission electron microscope. It was found that the blister skin thickness formed by D+ irradiation of polycrystalline tungsten (PCW) was considerably larger than the calculated ion range of the implants; however, this skin thickness (or blister depth) is not related to the pre-existing grain boundaries in the PCW. Blister formation was also observed with GIEM for single crystal tungsten (SCW) irradiated with H+, D+, and He+. The critical ion fluence for blister formation in SCW is estimated to be ∼1023 H+(D+)/m2 for H(D) and ∼1021 He+/m2 for He. The size of the blisters and their skin structure depends on the irradiating conditions. Typical skin thickness was about 50–150 nm. Based on the assumption that gas particles (H2, D2, and He) accumulate within the blisters during H+, D+, and He+ irradiation, the GIEM measurements provide a means to derive an estimate of the amount of gas so accumulated, by reproducing the observed blister shapes with finite element method (FEM) calculations. From the GIEM images and FEM calculations we have estimated the number of implanted ions being retained in the blisters, and compared these amounts with published retention measurements. A mechanism for the blister formation is proposed based on the present results.
言語 en
内容記述タイプ Abstract
出版者
言語 en
出版者 Elsevier
言語
言語 eng
資源タイプ
資源タイプresource http://purl.org/coar/resource_type/c_6501
タイプ journal article
出版タイプ
出版タイプ AM
出版タイプResource http://purl.org/coar/version/c_ab4af688f83e57aa
DOI
関連タイプ isVersionOf
識別子タイプ DOI
関連識別子 https://doi.org/10.1016/j.jnucmat.2009.01.298
ISSN
収録物識別子タイプ PISSN
収録物識別子 0022-3115
書誌情報 en : Journal of Nuclear Materials

巻 385, 号 3, p. 606-614, 発行日 2009-04
著者版フラグ
値 author
URI
識別子 http://dx.doi.org/10.1016/j.jnucmat.2009.01.298
識別子タイプ DOI
URI
識別子 http://hdl.handle.net/2237/20787
識別子タイプ HDL
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