{"_buckets": {"deposit": "006b85fe-6ed3-4950-b793-31a748bfcafa"}, "_deposit": {"id": "18731", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "18731"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00018731"}, "item_10_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2011-05", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "7", "bibliographicPageEnd": "1018", "bibliographicPageStart": "1015", "bibliographicVolumeNumber": "33", "bibliographic_titles": [{"bibliographic_title": "Optical Materials"}]}]}, "item_10_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "Energy-dispersive X-ray analysis based on electron channeling effects in transmission electron microscopy (TEM) was performed on Ca2SnO4 phosphor materials doped with Eu3+/Y3+ at various concentrations, which showed red photoluminescence associated with the Eu3+5D0\u20137F2 electric dipole transition. The method provided direct information on which host element site impurity elements occupy. The local atomic configurations and chemical bonding states associated with dopant impurities with different ionic radii were also examined by TEM\u2013electron energy-loss spectroscopy (TEM\u2013EELS).", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "DOI", "subitem_identifier_uri": "http://dx.doi.org/10.1016/j.optmat.2010.09.022"}, {"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/20827"}]}, "item_10_publisher_32": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "Elsevier"}]}, "item_10_rights_12": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "This is the author\u0027s version of a work that was accepted for publication in Optical Materials. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms, may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Optical Materials. v.33, n.7, 2011, p.1015\u20131018, DOI:10.1016/j.optmat.2010.09.022."}]}, "item_10_select_15": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "author"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0925-3467", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Muto, S."}], "nameIdentifiers": [{"nameIdentifier": "54592", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Fujimichi, Y."}], "nameIdentifiers": [{"nameIdentifier": "54593", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Tatsumi, K."}], "nameIdentifiers": [{"nameIdentifier": "54594", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kawano, T."}], "nameIdentifiers": [{"nameIdentifier": "54595", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Yamane, H."}], "nameIdentifiers": [{"nameIdentifier": "54596", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-21"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "OptMat20111.pdf", "filesize": [{"value": "404.8 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 404800.0, "url": {"label": "OptMat20111.pdf", "url": "https://nagoya.repo.nii.ac.jp/record/18731/files/OptMat20111.pdf"}, "version_id": "bd94b54c-9fdf-4c82-b002-c238462fe267"}]}, "item_keyword": {"attribute_name": "\u30ad\u30fc\u30ef\u30fc\u30c9", "attribute_value_mlt": [{"subitem_subject": "Rare-earth dopant", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Transmission electron microscopy", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Energy-dispersive X-ray analysis", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Electron energy-loss spectroscopy", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Electron channeling", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Site occupancy determination of Eu/Y doped in Ca2SnO4 phosphor by electron channeling microanalysis", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Site occupancy determination of Eu/Y doped in Ca2SnO4 phosphor by electron channeling microanalysis"}]}, "item_type_id": "10", "owner": "1", "path": ["320/321/322"], "permalink_uri": "http://hdl.handle.net/2237/20827", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_value": "2014-11-19"}, "publish_date": "2014-11-19", "publish_status": "0", "recid": "18731", "relation": {}, "relation_version_is_last": true, "title": ["Site occupancy determination of Eu/Y doped in Ca2SnO4 phosphor by electron channeling microanalysis"], "weko_shared_id": null}