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Development of an environmental high-voltage electron microscope for reaction science
http://hdl.handle.net/2237/20833
http://hdl.handle.net/2237/208332330061c-2934-4250-8c56-4d6c36f729b5
名前 / ファイル | ライセンス | アクション |
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2014-11-19 | |||||
タイトル | ||||||
タイトル | Development of an environmental high-voltage electron microscope for reaction science | |||||
言語 | en | |||||
著者 |
Tanaka, Nobuo
× Tanaka, Nobuo× Usukura, Jiro× Kusunoki, Michiko× Saito, Yahachi× Sasaki, Katuhiro× Tanji, Takayoshi× Muto, Shunsuke× Arai, Shigeo |
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アクセス権 | ||||||
アクセス権 | open access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_abf2 | |||||
権利 | ||||||
言語 | en | |||||
権利情報 | This is a pre-copyedited, author-produced PDF of an article accepted for publication in [Journal of electron microscopy] following peer review. The version of record [Journal of electron microscopy. v.62, n.1, 2013, p.205-215] is available online at: [http://dx.doi.org/10.1093/jmicro/dfs095]. | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | environmental high-voltage electron microscope | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | reaction science | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | in situ observation | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 3D tomographic observation | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | energy-filtered images in TEM/STEM | |||||
抄録 | ||||||
内容記述 | Environmental transmission electron microscopy and ultra-high resolution electron microscopic observation using aberration correctors have recently emerged as topics of great interest. The former method is an extension of the so-called in situ electron microscopy that has been performed since the 1970s. Current research in this area has been focusing on dynamic observation with atomic resolution under gaseous atmospheres and in liquids. Since 2007, Nagoya University has been developing a new 1-MV high voltage (scanning) transmission electron microscope that can be used to observe nanomaterials under conditions that include the presence of gases, liquids and illuminating lights, and it can be also used to perform mechanical operations to nanometre-sized areas as well as electron tomography and elemental analysis by electron energy loss spectroscopy. The new instrument has been used to image and analyse various types of samples including biological ones. | |||||
言語 | en | |||||
内容記述タイプ | Abstract | |||||
出版者 | ||||||
言語 | en | |||||
出版者 | Oxford University Press | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプresource | http://purl.org/coar/resource_type/c_6501 | |||||
タイプ | journal article | |||||
出版タイプ | ||||||
出版タイプ | AM | |||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
DOI | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | DOI | |||||
関連識別子 | https://doi.org/10.1093/jmicro/dfs095 | |||||
ISSN | ||||||
収録物識別子タイプ | PISSN | |||||
収録物識別子 | 0022-0744 | |||||
書誌情報 |
en : Journal of electron microscopy 巻 62, 号 1, p. 205-215, 発行日 2013-02 |
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著者版フラグ | ||||||
値 | author | |||||
URI | ||||||
識別子 | http://dx.doi.org/10.1093/jmicro/dfs095 | |||||
識別子タイプ | DOI | |||||
URI | ||||||
識別子 | http://hdl.handle.net/2237/20833 | |||||
識別子タイプ | HDL |