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{"_buckets": {"deposit": "7d91d410-a95b-4224-8d8f-1afa34e2de09"}, "_deposit": {"id": "18737", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "18737"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00018737", "sets": ["322"]}, "author_link": ["54622", "54623", "54624", "54625", "54626", "54627", "54628", "54629"], "item_10_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2013-02", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "1", "bibliographicPageEnd": "215", "bibliographicPageStart": "205", "bibliographicVolumeNumber": "62", "bibliographic_titles": [{"bibliographic_title": "Journal of electron microscopy", "bibliographic_titleLang": "en"}]}]}, "item_10_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "Environmental transmission electron microscopy and ultra-high resolution electron microscopic observation using aberration correctors have recently emerged as topics of great interest. The former method is an extension of the so-called in situ electron microscopy that has been performed since the 1970s. Current research in this area has been focusing on dynamic observation with atomic resolution under gaseous atmospheres and in liquids. Since 2007, Nagoya University has been developing a new 1-MV high voltage (scanning) transmission electron microscope that can be used to observe nanomaterials under conditions that include the presence of gases, liquids and illuminating lights, and it can be also used to perform mechanical operations to nanometre-sized areas as well as electron tomography and elemental analysis by electron energy loss spectroscopy. The new instrument has been used to image and analyse various types of samples including biological ones.", "subitem_description_language": "en", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "DOI", "subitem_identifier_uri": "http://dx.doi.org/10.1093/jmicro/dfs095"}, {"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/20833"}]}, "item_10_publisher_32": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "Oxford University Press", "subitem_publisher_language": "en"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://doi.org/10.1093/jmicro/dfs095", "subitem_relation_type_select": "DOI"}}]}, "item_10_rights_12": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "This is a pre-copyedited, author-produced PDF of an article accepted for publication in [Journal of electron microscopy] following peer review. The version of record [Journal of electron microscopy. v.62, n.1, 2013, p.205-215] is available online at: [http://dx.doi.org/10.1093/jmicro/dfs095].", "subitem_rights_language": "en"}]}, "item_10_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "author"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0022-0744", "subitem_source_identifier_type": "PISSN"}]}, "item_1615787544753": {"attribute_name": "出版タイプ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_ab4af688f83e57aa", "subitem_version_type": "AM"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "open access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_abf2"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Tanaka, Nobuo", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "54622", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Usukura, Jiro", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "54623", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kusunoki, Michiko", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "54624", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Saito, Yahachi", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "54625", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sasaki, Katuhiro", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "54626", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Tanji, Takayoshi", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "54627", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Muto, Shunsuke", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "54628", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Arai, Shigeo", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "54629", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-21"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "JEM_HVEM1209.pdf", "filesize": [{"value": "2.4 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_note", "mimetype": "application/pdf", "size": 2400000.0, "url": {"label": "JEM_HVEM1209.pdf", "objectType": "fulltext", "url": "https://nagoya.repo.nii.ac.jp/record/18737/files/JEM_HVEM1209.pdf"}, "version_id": "30fbd6ed-ddf6-409b-83fa-d850ed5d6aa5"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "environmental high-voltage electron microscope", "subitem_subject_scheme": "Other"}, {"subitem_subject": "reaction science", "subitem_subject_scheme": "Other"}, {"subitem_subject": "in situ observation", "subitem_subject_scheme": "Other"}, {"subitem_subject": "3D tomographic observation", "subitem_subject_scheme": "Other"}, {"subitem_subject": "energy-filtered images in TEM/STEM", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Development of an environmental high-voltage electron microscope for reaction science", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Development of an environmental high-voltage electron microscope for reaction science", "subitem_title_language": "en"}]}, "item_type_id": "10", "owner": "1", "path": ["322"], "permalink_uri": "http://hdl.handle.net/2237/20833", "pubdate": {"attribute_name": "PubDate", "attribute_value": "2014-11-19"}, "publish_date": "2014-11-19", "publish_status": "0", "recid": "18737", "relation": {}, "relation_version_is_last": true, "title": ["Development of an environmental high-voltage electron microscope for reaction science"], "weko_shared_id": -1}
  1. B200 工学部/工学研究科
  2. B200a 雑誌掲載論文
  3. 学術雑誌

Development of an environmental high-voltage electron microscope for reaction science

http://hdl.handle.net/2237/20833
http://hdl.handle.net/2237/20833
2330061c-2934-4250-8c56-4d6c36f729b5
名前 / ファイル ライセンス アクション
JEM_HVEM1209.pdf JEM_HVEM1209.pdf (2.4 MB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2014-11-19
タイトル
タイトル Development of an environmental high-voltage electron microscope for reaction science
言語 en
著者 Tanaka, Nobuo

× Tanaka, Nobuo

WEKO 54622

en Tanaka, Nobuo

Search repository
Usukura, Jiro

× Usukura, Jiro

WEKO 54623

en Usukura, Jiro

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Kusunoki, Michiko

× Kusunoki, Michiko

WEKO 54624

en Kusunoki, Michiko

Search repository
Saito, Yahachi

× Saito, Yahachi

WEKO 54625

en Saito, Yahachi

Search repository
Sasaki, Katuhiro

× Sasaki, Katuhiro

WEKO 54626

en Sasaki, Katuhiro

Search repository
Tanji, Takayoshi

× Tanji, Takayoshi

WEKO 54627

en Tanji, Takayoshi

Search repository
Muto, Shunsuke

× Muto, Shunsuke

WEKO 54628

en Muto, Shunsuke

Search repository
Arai, Shigeo

× Arai, Shigeo

WEKO 54629

en Arai, Shigeo

Search repository
アクセス権
アクセス権 open access
アクセス権URI http://purl.org/coar/access_right/c_abf2
権利
言語 en
権利情報 This is a pre-copyedited, author-produced PDF of an article accepted for publication in [Journal of electron microscopy] following peer review. The version of record [Journal of electron microscopy. v.62, n.1, 2013, p.205-215] is available online at: [http://dx.doi.org/10.1093/jmicro/dfs095].
キーワード
主題Scheme Other
主題 environmental high-voltage electron microscope
キーワード
主題Scheme Other
主題 reaction science
キーワード
主題Scheme Other
主題 in situ observation
キーワード
主題Scheme Other
主題 3D tomographic observation
キーワード
主題Scheme Other
主題 energy-filtered images in TEM/STEM
抄録
内容記述 Environmental transmission electron microscopy and ultra-high resolution electron microscopic observation using aberration correctors have recently emerged as topics of great interest. The former method is an extension of the so-called in situ electron microscopy that has been performed since the 1970s. Current research in this area has been focusing on dynamic observation with atomic resolution under gaseous atmospheres and in liquids. Since 2007, Nagoya University has been developing a new 1-MV high voltage (scanning) transmission electron microscope that can be used to observe nanomaterials under conditions that include the presence of gases, liquids and illuminating lights, and it can be also used to perform mechanical operations to nanometre-sized areas as well as electron tomography and elemental analysis by electron energy loss spectroscopy. The new instrument has been used to image and analyse various types of samples including biological ones.
言語 en
内容記述タイプ Abstract
出版者
言語 en
出版者 Oxford University Press
言語
言語 eng
資源タイプ
資源タイプresource http://purl.org/coar/resource_type/c_6501
タイプ journal article
出版タイプ
出版タイプ AM
出版タイプResource http://purl.org/coar/version/c_ab4af688f83e57aa
DOI
関連タイプ isVersionOf
識別子タイプ DOI
関連識別子 https://doi.org/10.1093/jmicro/dfs095
ISSN
収録物識別子タイプ PISSN
収録物識別子 0022-0744
書誌情報 en : Journal of electron microscopy

巻 62, 号 1, p. 205-215, 発行日 2013-02
著者版フラグ
値 author
URI
識別子 http://dx.doi.org/10.1093/jmicro/dfs095
識別子タイプ DOI
URI
識別子 http://hdl.handle.net/2237/20833
識別子タイプ HDL
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