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itemtype_ver1(1) |
公開日 |
2024-03-11 |
タイトル |
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タイトル |
Evaporable Fullerene Indanones with Controlled Amorphous Morphology as Electron Transport Layers for Inverted Perovskite Solar Cells |
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言語 |
en |
著者 |
Shui, Qing-Jun
Shan, Shiqi
Zhai, Yong-Chang
Aoyagi, Shinobu
Izawa, Seiichiro
Huda, Miftakhul
Yu, Chu-Yang
Zuo, Lijian
Chen, Hongzheng
Lin, Hao-Sheng
Matsuo, Yutaka
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アクセス権 |
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アクセス権 |
embargoed access |
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アクセス権URI |
http://purl.org/coar/access_right/c_f1cf |
権利 |
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言語 |
en |
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権利情報 |
This document is the Accepted Manuscript version of a Published Work that appeared in final form in [Journal of the American Chemical Society], copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see [https://pubs.acs.org/articlesonrequest/AOR-YEV5VINCAM6A9EAE2YC2].” |
内容記述 |
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内容記述 |
Fullerenes are among the most commonly used electron-transporting materials (ETMs) in inverted perovskite solar cells (IPSCs). Although versatile functionalized fullerene derivatives have shown excellent performance in IPSCs, pristine [60]fullerene (C60) is still the most widely used in devices mainly because of its uniform morphology by thermal deposition. However, thermally evaporable fullerene derivatives have not yet been achieved. Herein, we developed a series of evaporable fullerene derivatives, referred to as fullerene indanones (FIDOs), affording IPSCs with high power conversion efficiency (PCE) and long-term storage stability. The FIDOs were designed with a unique architecture in which the fullerene moiety and a benzene ring moiety are linked via a five-membered carbon ring in benzene ring plane. This molecular arrangement affords exceptional thermal stability, allowing the FIDOs to withstand harsh thermal deposition conditions. Moreover, by manipulating the steric bulk of the functional groups, we could control the state of the organic film from crystalline to amorphous. Subsequently, we used FIDOs as an electron transport layer (ETL) in IPSCs. Thanks to the suitable energy level and dual-passivation effect of FIDOs compared with a reference ETL using C60, the device using FIDOs achieved an open-circuit voltage of 1.16 V and a fill factor of 0.77. As a result, the PCE reached 22.11%, which is superior to 20.45% of the best-performing reference device. Most importantly, the FIDO-based IPSC devices exhibited exceptional stability in comparison to the reference device due to the stability of the amorphous ETL films. |
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言語 |
en |
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内容記述タイプ |
Abstract |
出版者 |
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言語 |
en |
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出版者 |
ACS Publications |
言語 |
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言語 |
eng |
資源タイプ |
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資源タイプresource |
http://purl.org/coar/resource_type/c_6501 |
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タイプ |
journal article |
出版タイプ |
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出版タイプ |
AM |
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出版タイプResource |
http://purl.org/coar/version/c_ab4af688f83e57aa |
関連情報 |
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関連タイプ |
isVersionOf |
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識別子タイプ |
DOI |
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関連識別子 |
https://doi.org/10.1021/jacs.3c07192 |
収録物識別子 |
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収録物識別子タイプ |
PISSN |
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収録物識別子 |
0002-7863 |
書誌情報 |
en : Journal of the American Chemical Society
巻 145,
号 50,
p. 27307-27315,
発行日 2023-12-20
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ファイル公開日 |
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日付 |
2024-12-20 |
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日付タイプ |
Available |