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  1. B200 工学部/工学研究科
  2. B200a 雑誌掲載論文
  3. 学術雑誌

Magnetization reversal of the domain structure in the anti-perovskite nitride Co3FeN investigated by high-resolution X-ray microscopy

http://hdl.handle.net/2237/25173
bd1a42fb-11f2-4265-bff5-53a6546a340c
名前 / ファイル ライセンス アクション
1_4948699.pdf 1_4948699.pdf ファイル公開:2017/05/09 (1.9 MB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2016-12-09
タイトル
タイトル Magnetization reversal of the domain structure in the anti-perovskite nitride Co3FeN investigated by high-resolution X-ray microscopy
著者 Hajiri, T.

× Hajiri, T.

WEKO 67905

Hajiri, T.

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Finizio, S.

× Finizio, S.

WEKO 67906

Finizio, S.

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Vafaee, M.

× Vafaee, M.

WEKO 67907

Vafaee, M.

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Kuroki, Y.

× Kuroki, Y.

WEKO 67908

Kuroki, Y.

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Ando, H.

× Ando, H.

WEKO 67909

Ando, H.

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Sakakibara, H.

× Sakakibara, H.

WEKO 67910

Sakakibara, H.

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Kleibert, A.

× Kleibert, A.

WEKO 67911

Kleibert, A.

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Howald, L.

× Howald, L.

WEKO 67912

Howald, L.

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Kronast, F.

× Kronast, F.

WEKO 67913

Kronast, F.

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Ueda, K.

× Ueda, K.

WEKO 67914

Ueda, K.

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Asano, H.

× Asano, H.

WEKO 67915

Asano, H.

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Kläui, M.

× Kläui, M.

WEKO 67916

Kläui, M.

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権利
権利情報 Copyright 2016 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing.The following article appeared in (Journal of Applied Physics. v.119, 2016, p.183901) and may be found at (http://doi.org/10.1063/1.4948699).
抄録
内容記述 We performed X-ray magnetic circular dichroism (XMCD) photoemission electron microscopy imaging to reveal the magnetic domain structure of anti-perovskite nitride Co3FeN exhibiting a negative spin polarization. In square and disc patterns, we systematically and quantitatively determined the statistics of the stable states as a function of geometry. By direct imaging during the application of a magnetic field, we revealed the magnetic reversal process in a spatially resolved manner. We compared the hysteresis on the continuous area and the square patterns from the magnetic field-dependent XMCD ratio, which can be explained as resulting from the effect of the shape anisotropy, present in nanostructured thin films.
内容記述タイプ Abstract
出版者
出版者 AIP Publishing
言語
言語 eng
資源タイプ
資源タイプresource http://purl.org/coar/resource_type/c_6501
タイプ journal article
ISSN
収録物識別子タイプ ISSN
収録物識別子 0021-8979
書誌情報 Journal of Applied Physics

巻 119, p. 183901-183901, 発行日 2016-05-09
著者版フラグ
値 publisher
URI
識別子 http://doi.org/10.1063/1.4948699
識別子タイプ DOI
URI
識別子 http://hdl.handle.net/2237/25173
識別子タイプ HDL
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