{"_buckets": {"deposit": "65738a15-3afa-4163-98b1-bc08ec9c44ab"}, "_deposit": {"id": "24360", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "24360"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00024360"}, "item_10_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2017-01-10", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "4", "bibliographicPageEnd": "7700305", "bibliographicPageStart": "7700305", "bibliographicVolumeNumber": "27", "bibliographic_titles": [{"bibliographic_title": "IEEE Transactions on Applied Superconductivity"}]}]}, "item_10_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "We have been investigating the electrical breakdown (BD) characteristics of liquid nitrogen (LN2) with a transient thermal stresses to simulate the quench conditions of resistive-type superconducting fault current limiters (SFCL). We call such BD of LN2 with the transient thermal stress as \u201cdynamic BD,\u201d and discriminate it from that with a continuous thermal stress. In this paper, we investigated the dynamic BD characteristics of LN2 for different LN2 pressures, electrode sizes, and terms of transient thermal stress input. In addition, we obtained the BD characteristics of LN2 with the continuous thermal stress, and compared them with the dynamic BD characteristics. Furthermore, we analyzed the statistical scattering of the time from the thermal stress input to the dynamic BD occurrence and discussed the dynamic BD mechanisms of LN2. We also proposed a flowchart of rational and reliable electrical insulation design of resistive-type SFCL based on the dynamic BD characteristics of LN2.", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "DOI", "subitem_identifier_uri": "http://doi.org/10.1109/TASC.2017.2651115"}, {"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/26569"}]}, "item_10_publisher_32": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "IEEE"}]}, "item_10_rights_12": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "\u201c\u00a9 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.\u201d"}]}, "item_10_select_15": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "author"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "1051-8223", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Hayakawa, Naoki"}], "nameIdentifiers": [{"nameIdentifier": "72143", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Matsuoka, Tatsuya"}], "nameIdentifiers": [{"nameIdentifier": "72144", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kojima, Hiroki"}], "nameIdentifiers": [{"nameIdentifier": "72145", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Isojima, Shigeki"}], "nameIdentifiers": [{"nameIdentifier": "72146", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kuwata, Minoru"}], "nameIdentifiers": [{"nameIdentifier": "72147", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-22"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "Dynamic_BD-Final.pdf", "filesize": [{"value": "455.9 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 455900.0, "url": {"label": "Dynamic_BD-Final.pdf", "url": "https://nagoya.repo.nii.ac.jp/record/24360/files/Dynamic_BD-Final.pdf"}, "version_id": "be469809-45ee-410b-a2ab-af8c198e37e5"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Breakdown Characteristics and Mechanisms of Liquid Nitrogen under Transient Thermal Stress for Superconducting Fault Current Limiters", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Breakdown Characteristics and Mechanisms of Liquid Nitrogen under Transient Thermal Stress for Superconducting Fault Current Limiters"}]}, "item_type_id": "10", "owner": "1", "path": ["320/321/322"], "permalink_uri": "http://hdl.handle.net/2237/26569", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_value": "2017-06-06"}, "publish_date": "2017-06-06", "publish_status": "0", "recid": "24360", "relation": {}, "relation_version_is_last": true, "title": ["Breakdown Characteristics and Mechanisms of Liquid Nitrogen under Transient Thermal Stress for Superconducting Fault Current Limiters"], "weko_shared_id": null}