{"_buckets": {"deposit": "6277ddcf-9a79-4703-88f1-a1db118b52c5"}, "_deposit": {"id": "25630", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "25630"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00025630", "sets": ["2070"]}, "author_link": ["98173", "98174"], "item_1615768549627": {"attribute_name": "出版タイプ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_9_alternative_title_19": {"attribute_name": "その他のタイトル", "attribute_value_mlt": [{"subitem_alternative_title": "What Makes Administering the National University Entrance Examination Multiple Times Difficult? : Testing Culture in Japan and Stated Reasons and Problems", "subitem_alternative_title_language": "en"}]}, "item_9_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2018-03", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "38", "bibliographicPageStart": "23", "bibliographicVolumeNumber": "18", "bibliographic_titles": [{"bibliographic_title": "名古屋高等教育研究", "bibliographic_titleLang": "ja"}]}]}, "item_9_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "大学入試における共通テストの複数回実施は、検討が始められてから30年経過してもまだ実現されていない。共通テストの複数回化は受検者にとって利益があるとされながら、日程上の問題や技術的な問題等を理由に見送られ続けている。日本のテスト文化も共通テストの複数回実施には適していない。しかし、近年実施されている、もしくは実施予定のいくつかのテストは、共通テストの複数回実施を可能にしうる要素を含んでいるように見受けられる。そこで本稿では、日本のテスト文化、これまで複数回実施が見送られてきた理由や課題、近年のテストの状況等の観点から、複数回実施の実現可能性について検討した。その結果、（1）選抜試験にするのか資格試験にするのかというテストの活用法の問題、（2）テスト得点の過度な重視とそれに起因する問題、（3）テストを合理的に設計・開発するための知識基盤が脆弱であるという問題、という3つの課題が依然残る要因として指摘された。", "subitem_description_language": "ja", "subitem_description_type": "Abstract"}, {"subitem_description": "Over 30 years have passed since multiple administration of the national university entrance examination was first considered. However, multiple administrations have still not been implemented. This paper examined what makes administering the examination multiple times difficult, especially considering testing culture in Japan, stated reasons and problems, and characteristics of several recent tests. Results revealed three remaining problems: (1) Whether the test should be used for selection or certification was unclear; (2) too much significance was placed on test scores; and (3) educational measurement and psychometrics have not become widespread in Japan.", "subitem_description_language": "en", "subitem_description_type": "Abstract"}]}, "item_9_description_5": {"attribute_name": "内容記述", "attribute_value_mlt": [{"subitem_description": "ファイル差し替え（2018/4/20）", "subitem_description_language": "ja", "subitem_description_type": "Other"}]}, "item_9_identifier_registration": {"attribute_name": "ID登録", "attribute_value_mlt": [{"subitem_identifier_reg_text": "10.18999/njhe.18.23", "subitem_identifier_reg_type": "JaLC"}]}, "item_9_publisher_32": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "名古屋大学高等教育研究センター", "subitem_publisher_language": "ja"}]}, "item_9_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_9_source_id_7": {"attribute_name": "ISSN（print）", "attribute_value_mlt": [{"subitem_source_identifier": "1348-2459", "subitem_source_identifier_type": "PISSN"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "open access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_abf2"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "石井, 秀宗", "creatorNameLang": "ja"}], "nameIdentifiers": [{"nameIdentifier": "98173", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "ISHII, Hidetoki", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "98174", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-04-09"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "02re.pdf", "filesize": [{"value": "1.3 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_note", "mimetype": "application/pdf", "size": 1300000.0, "url": {"label": "02re", "objectType": "fulltext", "url": "https://nagoya.repo.nii.ac.jp/record/25630/files/02re.pdf"}, "version_id": "2b5adfd1-da28-4c6e-aaa6-f1fb85c94297"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "jpn"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "departmental bulletin paper", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "大学入試における共通テストの複数回実施は実現可能か : 日本のテスト文化やこれまで見送られてきた理由などからの検討", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "大学入試における共通テストの複数回実施は実現可能か : 日本のテスト文化やこれまで見送られてきた理由などからの検討", "subitem_title_language": "ja"}]}, "item_type_id": "9", "owner": "1", "path": ["2070"], "permalink_uri": "https://doi.org/10.18999/njhe.18.23", "pubdate": {"attribute_name": "PubDate", "attribute_value": "2018-04-09"}, "publish_date": "2018-04-09", "publish_status": "0", "recid": "25630", "relation": {}, "relation_version_is_last": true, "title": ["大学入試における共通テストの複数回実施は実現可能か : 日本のテスト文化やこれまで見送られてきた理由などからの検討"], "weko_shared_id": -1}