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  1. F200 未来材料・システム研究所
  2. F200a 雑誌掲載論文
  3. 学術雑誌

Switching Field Distribution of MnGa Bit Patterned Film Fabricated by Ion Beam Irradiation

http://hdl.handle.net/2237/00027952
http://hdl.handle.net/2237/00027952
c1d7a6f0-c0a2-4506-b7f0-b0fa8d803011
名前 / ファイル ライセンス アクション
Manuscript_TMRC2017_Oshima_final_submit.pdf Manuscript_TMRC2017_Oshima_final_submit (5.6 MB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2018-05-09
タイトル
タイトル Switching Field Distribution of MnGa Bit Patterned Film Fabricated by Ion Beam Irradiation
言語 en
著者 Oshima, D.

× Oshima, D.

WEKO 76345

en Oshima, D.

Search repository
Kato, T.

× Kato, T.

WEKO 76346

en Kato, T.

Search repository
Iwata, S.

× Iwata, S.

WEKO 76347

en Iwata, S.

Search repository
アクセス権
アクセス権 open access
アクセス権URI http://purl.org/coar/access_right/c_abf2
権利
言語 en
権利情報 “© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.”
キーワード
主題Scheme Other
主題 Bit patterned media
キーワード
主題Scheme Other
主題 Ion beam irradiation
キーワード
主題Scheme Other
主題 Switching field distribution
キーワード
主題Scheme Other
主題 First order reversal curves
キーワード
主題Scheme Other
主題 MnGa
抄録
内容記述 The magnetization process and switching field distribution (SFD) of ion beam patterned MnGa films were discussed based on the first-order reversal curve (FORC) analysis and magnetic force microscope (MFM) observations. The FORC diagrams with so-called “boomerang” shape resulting from the increase of the interaction between “hysterons” that can be associated with ferromagnetic particles and/or domains were confirmed in the patterned MnGa with dot size larger than 520 nm. On the other hand, the shape of the FORC diagram became a simple Gaussian distribution, which is typical in the media comprised of well-isolated magnetic particles, for dot size smaller than 240 nm. The variation of the shape of FORC diagram was closely linked with the domain structure observed by MFM; multidomain in the dot was confirmed for dot size larger than 520 nm while single domain for dot size less than 240 nm. The average switching field of the patterned film increased with decreasing the dot size, indicating that the dot edge damage and exchange interaction through ion-irradiated regions were negligible in the ion-beam patterned MnGa. The SFD also increased with decreasing the dot size. The SFD is considered to result from the existence of the pinning centers in the as-prepared MnGa and also from the dot size fluctuation of the resist masks fabricated by electron beam lithography. The optimization of the fabrication process will be effective to reduce SFD and sufficiently low SFD in high-density MnGa bit patterned media will be achieved by these process optimizations.
言語 en
内容記述タイプ Abstract
出版者
言語 en
出版者 IEEE
言語
言語 eng
資源タイプ
資源タイプresource http://purl.org/coar/resource_type/c_6501
タイプ journal article
出版タイプ
出版タイプ AM
出版タイプResource http://purl.org/coar/version/c_ab4af688f83e57aa
DOI
関連タイプ isVersionOf
識別子タイプ DOI
関連識別子 https://doi.org/10.1109/TMAG.2017.2733765
ISSN
収録物識別子タイプ PISSN
収録物識別子 0018-9464
書誌情報 en : IEEE Transactions on Magnetics

巻 54, 号 2, p. 3200207, 発行日 2018-02
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