ログイン
言語:

WEKO3

  • トップ
  • ランキング
To
lat lon distance
To

Field does not validate



インデックスリンク

インデックスツリー

メールアドレスを入力してください。

WEKO

One fine body…

WEKO

One fine body…

アイテム

{"_buckets": {"deposit": "8ad4339e-85cd-4d71-82bd-3e1fdb1e7b77"}, "_deposit": {"id": "26219", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "26219"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00026219", "sets": ["322"]}, "author_link": ["78626", "78627", "78628", "78629", "78630", "78631"], "item_10_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2018-06", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "14", "bibliographicPageStart": "8", "bibliographicVolumeNumber": "122", "bibliographic_titles": [{"bibliographic_title": "Tribology International", "bibliographic_titleLang": "en"}]}]}, "item_10_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "A method based on vertical-objective-based ellipsometric microscopy (VEM) is presented for measuring lubricant film thickness in nanometer sliding gaps. It provides an image of nanometer-thick lubricating films in real time at high lateral and thickness resolutions without any special layers. The ellipsometric image is directly converted into the film image by using a piezo-stage displacement method combined with a rotating compensator ellipsometry method. The accuracy of thickness measurement is about 1 nm. The VEM-based method revealed that nanometric deformation of the sliding surfaces arises in nanometric gaps even if the load is low, which significantly affects the lubrication properties in small gaps. This method is useful for clarifying the lubrication phenomena in nanometric sliding gaps.", "subitem_description_language": "en", "subitem_description_type": "Abstract"}]}, "item_10_description_5": {"attribute_name": "内容記述", "attribute_value_mlt": [{"subitem_description": "ファイル公開:2020-06-01", "subitem_description_language": "ja", "subitem_description_type": "Other"}]}, "item_10_publisher_32": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "Elsevier", "subitem_publisher_language": "en"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://doi.org/10.1016/j.triboint.2018.02.016", "subitem_relation_type_select": "DOI"}}]}, "item_10_rights_12": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "© 2018. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/ ", "subitem_rights_language": "en"}]}, "item_10_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "author"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0301-679X", "subitem_source_identifier_type": "PISSN"}]}, "item_1615787544753": {"attribute_name": "出版タイプ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_ab4af688f83e57aa", "subitem_version_type": "AM"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "open access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_abf2"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Fukuzawa, Kenji", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "78626", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sasao, Yusuke", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "78627", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Namba, Katsuya", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "78628", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Yamashita, Chihiro", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "78629", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Itoh, Shintaro", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "78630", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Zhang, Hedong", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "78631", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2020-06-01"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "TI_manuscript_Fukuzawa_Rev1_2.pdf", "filesize": [{"value": "653.4 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_note", "mimetype": "application/pdf", "size": 653400.0, "url": {"label": "TI_manuscript_Fukuzawa_Rev1_2", "objectType": "fulltext", "url": "https://nagoya.repo.nii.ac.jp/record/26219/files/TI_manuscript_Fukuzawa_Rev1_2.pdf"}, "version_id": "a320a953-636b-4be1-a603-ea11ea6fc266"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "Lubricant film", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Film thickness measurement", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Nanometer gap", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Nanotribology", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Ellipsometry", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Measurement of nanometer-thick lubricating films using ellipsometric microscopy", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Measurement of nanometer-thick lubricating films using ellipsometric microscopy", "subitem_title_language": "en"}]}, "item_type_id": "10", "owner": "1", "path": ["322"], "permalink_uri": "http://hdl.handle.net/2237/00028423", "pubdate": {"attribute_name": "PubDate", "attribute_value": "2018-08-06"}, "publish_date": "2018-08-06", "publish_status": "0", "recid": "26219", "relation": {}, "relation_version_is_last": true, "title": ["Measurement of nanometer-thick lubricating films using ellipsometric microscopy"], "weko_shared_id": -1}
  1. B200 工学部/工学研究科
  2. B200a 雑誌掲載論文
  3. 学術雑誌

Measurement of nanometer-thick lubricating films using ellipsometric microscopy

http://hdl.handle.net/2237/00028423
http://hdl.handle.net/2237/00028423
7bdc6329-a67a-42fe-9934-60c2b18f9579
名前 / ファイル ライセンス アクション
TI_manuscript_Fukuzawa_Rev1_2.pdf TI_manuscript_Fukuzawa_Rev1_2 (653.4 kB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2018-08-06
タイトル
タイトル Measurement of nanometer-thick lubricating films using ellipsometric microscopy
言語 en
著者 Fukuzawa, Kenji

× Fukuzawa, Kenji

WEKO 78626

en Fukuzawa, Kenji

Search repository
Sasao, Yusuke

× Sasao, Yusuke

WEKO 78627

en Sasao, Yusuke

Search repository
Namba, Katsuya

× Namba, Katsuya

WEKO 78628

en Namba, Katsuya

Search repository
Yamashita, Chihiro

× Yamashita, Chihiro

WEKO 78629

en Yamashita, Chihiro

Search repository
Itoh, Shintaro

× Itoh, Shintaro

WEKO 78630

en Itoh, Shintaro

Search repository
Zhang, Hedong

× Zhang, Hedong

WEKO 78631

en Zhang, Hedong

Search repository
アクセス権
アクセス権 open access
アクセス権URI http://purl.org/coar/access_right/c_abf2
権利
言語 en
権利情報 © 2018. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/
キーワード
主題Scheme Other
主題 Lubricant film
キーワード
主題Scheme Other
主題 Film thickness measurement
キーワード
主題Scheme Other
主題 Nanometer gap
キーワード
主題Scheme Other
主題 Nanotribology
キーワード
主題Scheme Other
主題 Ellipsometry
抄録
内容記述 A method based on vertical-objective-based ellipsometric microscopy (VEM) is presented for measuring lubricant film thickness in nanometer sliding gaps. It provides an image of nanometer-thick lubricating films in real time at high lateral and thickness resolutions without any special layers. The ellipsometric image is directly converted into the film image by using a piezo-stage displacement method combined with a rotating compensator ellipsometry method. The accuracy of thickness measurement is about 1 nm. The VEM-based method revealed that nanometric deformation of the sliding surfaces arises in nanometric gaps even if the load is low, which significantly affects the lubrication properties in small gaps. This method is useful for clarifying the lubrication phenomena in nanometric sliding gaps.
言語 en
内容記述タイプ Abstract
内容記述
内容記述 ファイル公開:2020-06-01
言語 ja
内容記述タイプ Other
出版者
言語 en
出版者 Elsevier
言語
言語 eng
資源タイプ
資源タイプresource http://purl.org/coar/resource_type/c_6501
タイプ journal article
出版タイプ
出版タイプ AM
出版タイプResource http://purl.org/coar/version/c_ab4af688f83e57aa
DOI
関連タイプ isVersionOf
識別子タイプ DOI
関連識別子 https://doi.org/10.1016/j.triboint.2018.02.016
ISSN
収録物識別子タイプ PISSN
収録物識別子 0301-679X
書誌情報 en : Tribology International

巻 122, p. 8-14, 発行日 2018-06
著者版フラグ
値 author
戻る
0
views
See details
Views

Versions

Ver.1 2021-03-01 11:49:56.625296
Show All versions

Share

Mendeley Twitter Facebook Print Addthis

Cite as

エクスポート

OAI-PMH
  • OAI-PMH JPCOAR
  • OAI-PMH DublinCore
  • OAI-PMH DDI
Other Formats
  • JSON
  • BIBTEX

Confirm


Powered by WEKO3


Powered by WEKO3