{"_buckets": {"deposit": "f9720055-02e8-4549-85d1-ff9747207789"}, "_deposit": {"id": "30356", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "30356"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00030356", "sets": ["2514"]}, "author_link": ["100872", "100873"], "item_1615768549627": {"attribute_name": "出版タイプ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_9_alternative_title_19": {"attribute_name": "その他のタイトル", "attribute_value_mlt": [{"subitem_alternative_title": "Status report on the electron probe microanalyzer (EPMA), XRF and XRD at Division for Chronological Research, Institute for Space–Earth Environmental Research, Nagoya University in 2019", "subitem_alternative_title_language": "en"}]}, "item_9_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2020-06", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "75", "bibliographicPageStart": "72", "bibliographicVolumeNumber": "4", "bibliographic_titles": [{"bibliographic_title": "名古屋大学年代測定研究", "bibliographic_titleLang": "ja"}]}]}, "item_9_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "CHIME (chemical Th-U-total Pb isochron method) dating and quantitative analysis of ultra-trace elements are performed with two JCXA-733 (JEOL, Tokyo) electron probe microanalyzers (EPMA) at Division for Chronological Research, Institute for Space–Earth Environmental Research (ISEE), Nagoya University. X-ray fluorescence spectrometer (XRF-1800, Shimadzu, Kyoto) and X-ray diffractometer (MiniFlex, Rigaku, Tokyo) are also provided for the joint research program of ISEE in addition to EPMA. The control computers of XRF and XRD have been replaced by the 64-bit version of Windows 10 based computers.", "subitem_description_language": "en", "subitem_description_type": "Abstract"}, {"subitem_description": "名古屋大学宇宙地球環境研究所年代測定研究部では、2台の電子プローブマイクロアナライザー（EPMA、日本電子株式会社製JCXA-733）を用い、U-Th-Pb系のサブグレン年代測定や極微量元素定量分析を実施している。また、今年度から蛍光エックス線装置（株式会社島津製作所製XRF-1800）およびエックス線回折計（株式会社リガク製MiniFlex）も共同利用・共同研究対処機器としている。XRFとXRDの制御用PCを64ビット版Windows 10を搭載したものに置き換えた。", "subitem_description_language": "ja", "subitem_description_type": "Abstract"}]}, "item_9_identifier_registration": {"attribute_name": "ID登録", "attribute_value_mlt": [{"subitem_identifier_reg_text": "10.18999/nagubc.4.72", "subitem_identifier_reg_type": "JaLC"}]}, "item_9_publisher_32": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "名古屋大学宇宙地球環境研究所", "subitem_publisher_language": "ja"}]}, "item_9_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "open access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_abf2"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "加藤, 丈典", "creatorNameLang": "ja"}], "nameIdentifiers": [{"nameIdentifier": "100872", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kato, Takenori", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "100873", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2020-08-04"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "072-075_2019.pdf", "filesize": [{"value": "1.3 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_note", "mimetype": "application/pdf", "size": 1300000.0, "url": {"label": "072-075_2019.pdf", "objectType": "fulltext", "url": "https://nagoya.repo.nii.ac.jp/record/30356/files/072-075_2019.pdf"}, "version_id": "dbef6702-cc62-4ffb-89c3-cd3daa9a6208"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "Electron Probe Microanalysis (EPMA)", "subitem_subject_scheme": "Other"}, {"subitem_subject": "CHIME dating", "subitem_subject_scheme": "Other"}, {"subitem_subject": "X-ray spectrometry", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "jpn"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "departmental bulletin paper", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "名古屋大学宇宙地球環境研究所年代測定研究部における電子プローブマイクロアナライザー（EPMA）、蛍光X線分析装置およびX線回折計の状況（2019年度）", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "名古屋大学宇宙地球環境研究所年代測定研究部における電子プローブマイクロアナライザー（EPMA）、蛍光X線分析装置およびX線回折計の状況（2019年度）", "subitem_title_language": "ja"}]}, "item_type_id": "9", "owner": "1", "path": ["2514"], "permalink_uri": "https://doi.org/10.18999/nagubc.4.72", "pubdate": {"attribute_name": "PubDate", "attribute_value": "2020-08-04"}, "publish_date": "2020-08-04", "publish_status": "0", "recid": "30356", "relation": {}, "relation_version_is_last": true, "title": ["名古屋大学宇宙地球環境研究所年代測定研究部における電子プローブマイクロアナライザー（EPMA）、蛍光X線分析装置およびX線回折計の状況（2019年度）"], "weko_shared_id": -1}