{"_buckets": {"deposit": "995b93a5-cb3f-4dda-9a52-293965a08039"}, "_deposit": {"id": "5176", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "5176"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00005176"}, "item_10_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2000-04", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "2", "bibliographicPageEnd": "295", "bibliographicPageStart": "290", "bibliographicVolumeNumber": "7", "bibliographic_titles": [{"bibliographic_title": "IEEE Transactions on Dielectrics and Electrical Insulation [see also IEEE Transactions on Electrical Insulation]"}]}]}, "item_10_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "In this paper, we investigated quench-induced dynamic breakdown characteristics of liquid helium (LHc) under both non-uniform and uniform electric field. Experimental results for various quench conditions revealed that the dynamic breakdown voltage of LHe increased with decreasing the effective post-quench thermal energy density and with increasing the gap length and pressure, because of the suppression of thermal bubble disturbance in LHc. All of the experimental data enabled us to establish the 3-dimensionally systematized diagram of dynamic breakdown voltage of LHe as a function of effective post-quench thermal energy density, gap length and pressure,", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/6761"}]}, "item_10_publisher_32": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "IEEE"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "http://dx.doi.org/10.1109/94.841823", "subitem_relation_type_select": "DOI"}}]}, "item_10_rights_12": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "Copyright \u00a9 2000 IEEE. Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University\u2019s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org."}]}, "item_10_select_15": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "1070-9878", "subitem_source_identifier_type": "ISSN"}]}, "item_10_text_14": {"attribute_name": "\u30d5\u30a9\u30fc\u30de\u30c3\u30c8", "attribute_value_mlt": [{"subitem_text_value": "application/pdf"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Chigusa, S."}], "nameIdentifiers": [{"nameIdentifier": "12984", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hayakawa, N."}], "nameIdentifiers": [{"nameIdentifier": "12985", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Okubo, H."}], "nameIdentifiers": [{"nameIdentifier": "12986", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-19"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "00841823.pdf", "filesize": [{"value": "561.8 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 561800.0, "url": {"label": "00841823.pdf", "url": "https://nagoya.repo.nii.ac.jp/record/5176/files/00841823.pdf"}, "version_id": "b95c0823-d2c0-4f9e-b75e-d40c25e72b7f"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Static and dynamic breakdown characteristics of liquid helium for insulation design of superconducting power equipment", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Static and dynamic breakdown characteristics of liquid helium for insulation design of superconducting power equipment"}]}, "item_type_id": "10", "owner": "1", "path": ["320/321/322"], "permalink_uri": "http://hdl.handle.net/2237/6761", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_name_i18n": "\u516c\u958b\u65e5", "attribute_value": "2006-07-31"}, "publish_date": "2006-07-31", "publish_status": "0", "recid": "5176", "relation": {}, "relation_version_is_last": true, "title": ["Static and dynamic breakdown characteristics of liquid helium for insulation design of superconducting power equipment"], "weko_shared_id": 3}