{"_buckets": {"deposit": "e7210a3b-7d33-4959-9c66-8901a68d1df0"}, "_deposit": {"id": "5194", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "5194"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00005194"}, "item_10_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2005-06", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "2", "bibliographicPageEnd": "3733", "bibliographicPageStart": "3730", "bibliographicVolumeNumber": "15", "bibliographic_titles": [{"bibliographic_title": "IEEE Transactions on Applied Superconductivity"}]}]}, "item_10_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "A-axis oriented epitaxial REBa2Cu3Oy (RE123) thin film performs excellent superconducting properties in magnetic field. Recently, we reported that a critical current density (Jc) in the RE123 thin film was improved by a deliberate composition control. A Sm1+x Ba2-xCu3Oy (Sm123) thin film with a small amount of Sm/Ba substitution x showed the great Jc \uff5e 0.17 MA cm2 in 5 T at 77.3 K, while the Jc in (Yb1 Nd )Ba2Cu3Oy (Yb/Nd123) thin films depended on an amount of mixed crystal ratio . In this report, we studied Jc as a function of magnetic field and field orientation with respect to ab-planes. In low magnetic field, the Jc of Sm123 thin film was almost independent of the applied angle of the field. In the case of Yb/Nd123 thin film, extremely high Jc were observed when the magnetic field was aligned parallel or perpendicular to the surface of the film. Because compositional fluctuations in RE123 thin films were observed by transmission electron microscopy, we found that the pinning centers in RE123 thin films are strongly affected by the composition in the thin films.", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/6777"}]}, "item_10_publisher_32": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "IEEE"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "http://dx.doi.org/10.1109/TASC.2005.849416", "subitem_relation_type_select": "DOI"}}]}, "item_10_rights_12": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "Copyright \u00a9 2005 IEEE. Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University\u2019s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org."}]}, "item_10_select_15": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_text_14": {"attribute_name": "\u30d5\u30a9\u30fc\u30de\u30c3\u30c8", "attribute_value_mlt": [{"subitem_text_value": "application/pdf"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Ichino, Y."}], "nameIdentifiers": [{"nameIdentifier": "13064", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Honda, R."}], "nameIdentifiers": [{"nameIdentifier": "13065", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Miura, M."}], "nameIdentifiers": [{"nameIdentifier": "13066", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Itoh, M."}], "nameIdentifiers": [{"nameIdentifier": "13067", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Yoshida, Y."}], "nameIdentifiers": [{"nameIdentifier": "13068", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Takai, Y."}], "nameIdentifiers": [{"nameIdentifier": "13069", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Matsumoto, K."}], "nameIdentifiers": [{"nameIdentifier": "13070", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Mukaida, M."}], "nameIdentifiers": [{"nameIdentifier": "13071", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Ichinose, A."}], "nameIdentifiers": [{"nameIdentifier": "13072", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-19"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "01440482.pdf", "filesize": [{"value": "440.0 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 440000.0, "url": {"label": "01440482.pdf", "url": "https://nagoya.repo.nii.ac.jp/record/5194/files/01440482.pdf"}, "version_id": "83049394-11f9-4148-9971-ba5fd98f7a94"}]}, "item_keyword": {"attribute_name": "\u30ad\u30fc\u30ef\u30fc\u30c9", "attribute_value_mlt": [{"subitem_subject": "Critical current density", "subitem_subject_scheme": "Other"}, {"subitem_subject": "magnetic field", "subitem_subject_scheme": "Other"}, {"subitem_subject": "REBa2Cu3O", "subitem_subject_scheme": "Other"}, {"subitem_subject": "thin film", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Microstructure and field angle dependence of critical current densities in REBa/sub 2/Cu/sub 3/O/sub y/ thin films prepared by PLD method", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Microstructure and field angle dependence of critical current densities in REBa/sub 2/Cu/sub 3/O/sub y/ thin films prepared by PLD method"}]}, "item_type_id": "10", "owner": "1", "path": ["320/321/322"], "permalink_uri": "http://hdl.handle.net/2237/6777", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_name_i18n": "\u516c\u958b\u65e5", "attribute_value": "2006-08-01"}, "publish_date": "2006-08-01", "publish_status": "0", "recid": "5194", "relation": {}, "relation_version_is_last": true, "title": ["Microstructure and field angle dependence of critical current densities in REBa/sub 2/Cu/sub 3/O/sub y/ thin films prepared by PLD method"], "weko_shared_id": 3}