{"_buckets": {"deposit": "0f057980-9671-4f8a-9928-c4fbf6a86eb0"}, "_deposit": {"id": "5218", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "5218"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00005218", "sets": ["322"]}, "author_link": ["13171", "13172", "13173"], "item_10_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1991-10", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "5", "bibliographicPageEnd": "893", "bibliographicPageStart": "885", "bibliographicVolumeNumber": "19", "bibliographic_titles": [{"bibliographic_title": "IEEE Transactions on Plasma Science", "bibliographic_titleLang": "en"}]}]}, "item_10_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "It was found in the HYBTOK-Ⅱ tokamak that the negative change of the electric potential of the plasma by a limiter biasing is influenced senseitivity by the magnetic configuration in the SOL, but the positive change is not. The concept of “effective area\" is introduced to explain the potential change due to a horizontal shift of plasma column in the negative biasing. Employing such a concept, a simple model for the formation of electric potential in a plasma for both a cold and an electron-emitting limiter is presented. It explains qualitatively the experimental results. The positive biasing was found to enhance the radial electric field at the scrape off layer, and also at the inside, close to the last-closed magnetic flux surface, and seems to increase the particle confinement as measured by an increased line-averaged electron density with decreased Hα and impurity line intensities, along with a stabilization of the magnetic and electrostatic fluctuations.", "subitem_description_language": "en", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/6802"}]}, "item_10_publisher_32": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "IEEE", "subitem_publisher_language": "en"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://doi.org/10.1109/27.108430", "subitem_relation_type_select": "DOI"}}]}, "item_10_rights_12": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright © 1991 IEEE. Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.", "subitem_rights_language": "en"}]}, "item_10_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0093-3813", "subitem_source_identifier_type": "PISSN"}]}, "item_10_text_14": {"attribute_name": "フォーマット", "attribute_value_mlt": [{"subitem_text_value": "application/pdf"}]}, "item_1615787544753": {"attribute_name": "出版タイプ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "open access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_abf2"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Takamura, Shuichi", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "13171", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kinoshita, Shigeru", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "13172", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Uesugi, Yoshihiko", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "13173", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-19"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "trans_pla_sci_1905.pdf", "filesize": [{"value": "1.3 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_note", "mimetype": "application/pdf", "size": 1300000.0, "url": {"label": "trans_pla_sci_1905.pdf", "objectType": "fulltext", "url": "https://nagoya.repo.nii.ac.jp/record/5218/files/trans_pla_sci_1905.pdf"}, "version_id": "0da91008-a32f-44e3-a1c3-760b417caff0"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Formation of electric potential in a tokamak edge by limiter biasing", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Formation of electric potential in a tokamak edge by limiter biasing", "subitem_title_language": "en"}]}, "item_type_id": "10", "owner": "1", "path": ["322"], "permalink_uri": "http://hdl.handle.net/2237/6802", "pubdate": {"attribute_name": "PubDate", "attribute_value": "2006-08-04"}, "publish_date": "2006-08-04", "publish_status": "0", "recid": "5218", "relation": {}, "relation_version_is_last": true, "title": ["Formation of electric potential in a tokamak edge by limiter biasing"], "weko_shared_id": -1}