{"_buckets": {"deposit": "9958ac1f-692c-490f-a281-4778ddf646d4"}, "_deposit": {"id": "5230", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "5230"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00005230"}, "item_10_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1995-06", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "3", "bibliographicPageEnd": "384", "bibliographicPageStart": "376", "bibliographicVolumeNumber": "2", "bibliographic_titles": [{"bibliographic_title": "IEEE Transactions on Dielectrics and Electrical Insulation [see also IEEE Transactions on Electrical Insulation]"}]}]}, "item_10_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "We measured dc and ac breakdown voltages in liquid nitrogen (LN_2) with a sphere-to-plane electrode configuration. Experimental results revealed that the breakdown voltage in LN_2 did not increase monotonously but partially decreased as the sphere diameter increased at a constant gap length. Thus, the existence of the area and the volume effects on the breakdown voltage in LN_2 was verified quantitatively; the breakdown strength decreased whwen increasing the {SEA}_90 (90% stressed electorode area) and the {SLV}_90 (90% stressed liquid volume). By changing the experimental conditions, it was verified that both area and volume effects, havinga mutual correlation, simultaneously lead to the degradation of the breakdown strength in LN_2. In order to examine the area and the volume effects for the larger {SEA}_90 and {SLV}_90, we also measured the breakdown voltage with a coaxial cylindrical electrode. It was concluded that the dc and ac breakdown strengths in LN_2 decreased as the {SEA}_90 and the {SLV}_90 increased varying widely from 10^0 to 10^5 \u339c^2 and from 10^-1 to 10^5 \u339c^3, respectively.", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/6818"}]}, "item_10_publisher_32": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "IEEE"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "http://dx.doi.org/10.1109/94.395426", "subitem_relation_type_select": "DOI"}}]}, "item_10_rights_12": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "Copyright \u00a9 1995 IEEE. Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University\u2019s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org."}]}, "item_10_select_15": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "1070-9878", "subitem_source_identifier_type": "ISSN"}]}, "item_10_text_14": {"attribute_name": "\u30d5\u30a9\u30fc\u30de\u30c3\u30c8", "attribute_value_mlt": [{"subitem_text_value": "application/pdf"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Goshima, H."}], "nameIdentifiers": [{"nameIdentifier": "13220", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hayakawa, N."}], "nameIdentifiers": [{"nameIdentifier": "13221", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hikita, M."}], "nameIdentifiers": [{"nameIdentifier": "13222", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Okubo, H."}], "nameIdentifiers": [{"nameIdentifier": "13223", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Uchida, K."}], "nameIdentifiers": [{"nameIdentifier": "13224", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-19"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "dei_2_3_376.pdf", "filesize": [{"value": "3.0 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 3000000.0, "url": {"label": "dei_2_3_376.pdf", "url": "https://nagoya.repo.nii.ac.jp/record/5230/files/dei_2_3_376.pdf"}, "version_id": "7c86d109-149b-474c-99aa-5b7d9efaa6b8"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Area and volume effects on breakdown strength in liquid nitrogen", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Area and volume effects on breakdown strength in liquid nitrogen"}]}, "item_type_id": "10", "owner": "1", "path": ["320/321/322"], "permalink_uri": "http://hdl.handle.net/2237/6818", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_value": "2006-08-08"}, "publish_date": "2006-08-08", "publish_status": "0", "recid": "5230", "relation": {}, "relation_version_is_last": true, "title": ["Area and volume effects on breakdown strength in liquid nitrogen"], "weko_shared_id": 3}