{"_buckets": {"deposit": "aa96b7d7-972c-4e0d-962c-e8b1a7753f7e"}, "_deposit": {"id": "7844", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "7844"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00007844"}, "item_10_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2007", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "1536", "bibliographicPageStart": "1533", "bibliographic_titles": [{"bibliographic_title": "Solid-State Sensors, Actuators and Microsystems Conference"}]}]}, "item_10_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "We developed a novel type of quartz tuning-fork probe that vibrates and detects its own probe deformation, for application to atomic force microscopy (AFM). This tuning-fork probe improves the AFM image resolution because of its high Q (quality) factor value. The tuning-fork probe has a sharp tip that was fabricated using anisotropic wet etching and a focused ion beam system. We evaluated the vibration properties of the tuning-fork in both the in-phase and anti-phase driving mode, and measured a Q factor value of 2808 in the anti-phase mode. We also confirmed that the tuning-fork probe is able to measure a 100 nm-step on a silicon surface by self-vibration and self-detection, without using external vibration and optical-detection mechanisms.", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/9564"}]}, "item_10_publisher_32": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "IEEE"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "http://dx.doi.org/10.1109/SENSOR.2007.4300437", "subitem_relation_type_select": "DOI"}}]}, "item_10_relation_8": {"attribute_name": "ISBN", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "1-4244-0842-3", "subitem_relation_type_select": "ISBN"}}]}, "item_10_rights_12": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "Copyright \u00a9 2007 IEEE. Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University\u2019s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org."}]}, "item_10_select_15": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_text_14": {"attribute_name": "\u30d5\u30a9\u30fc\u30de\u30c3\u30c8", "attribute_value_mlt": [{"subitem_text_value": "application/pdf"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Hida, H."}], "nameIdentifiers": [{"nameIdentifier": "22391", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Shikida, M."}], "nameIdentifiers": [{"nameIdentifier": "22392", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Fukuzawa, K."}], "nameIdentifiers": [{"nameIdentifier": "22393", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Ono, A."}], "nameIdentifiers": [{"nameIdentifier": "22394", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sato, K."}], "nameIdentifiers": [{"nameIdentifier": "22395", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Asaumi, K."}], "nameIdentifiers": [{"nameIdentifier": "22396", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Iriye, Y."}], "nameIdentifiers": [{"nameIdentifier": "22397", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Muramatsu, T."}], "nameIdentifiers": [{"nameIdentifier": "22398", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Horikawa, Y."}], "nameIdentifiers": [{"nameIdentifier": "22399", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sato, K."}], "nameIdentifiers": [{"nameIdentifier": "22400", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-19"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "shik_10.pdf", "filesize": [{"value": "388.8 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 388800.0, "url": {"label": "shik_10.pdf", "url": "https://nagoya.repo.nii.ac.jp/record/7844/files/shik_10.pdf"}, "version_id": "14e80457-c419-4e2f-9b57-53c0d1f816b9"}]}, "item_keyword": {"attribute_name": "\u30ad\u30fc\u30ef\u30fc\u30c9", "attribute_value_mlt": [{"subitem_subject": "Atomic Force Microscopy (AFM)", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Quartz tuning-fork", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Piezoelectric", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Development of Self-Vibration and -Detection AFM Probe by using Quartz Tuning Fork", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Development of Self-Vibration and -Detection AFM Probe by using Quartz Tuning Fork"}]}, "item_type_id": "10", "owner": "1", "path": ["320/321/322"], "permalink_uri": "http://hdl.handle.net/2237/9564", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_name_i18n": "\u516c\u958b\u65e5", "attribute_value": "2008-03-04"}, "publish_date": "2008-03-04", "publish_status": "0", "recid": "7844", "relation": {}, "relation_version_is_last": true, "title": ["Development of Self-Vibration and -Detection AFM Probe by using Quartz Tuning Fork"], "weko_shared_id": 3}