{"_buckets": {"deposit": "406a76c9-98fd-4891-a649-dcb53e669988"}, "_deposit": {"id": "8546", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "8546"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00008546"}, "item_10_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2002-08", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "25", "bibliographicPageStart": "24", "bibliographicVolumeNumber": "8", "bibliographic_titles": [{"bibliographic_title": "Microscopy and Microanalysis"}]}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/10294"}]}, "item_10_publisher_32": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "Cambridge University Press"}]}, "item_10_rights_12": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "Cambridge University Press"}]}, "item_10_select_15": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "1431-9276", "subitem_source_identifier_type": "ISSN"}]}, "item_10_text_14": {"attribute_name": "\u30d5\u30a9\u30fc\u30de\u30c3\u30c8", "attribute_value_mlt": [{"subitem_text_value": "application/pdf"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Yamamoto, K."}], "nameIdentifiers": [{"nameIdentifier": "24014", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hirayama, T."}], "nameIdentifiers": [{"nameIdentifier": "24015", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Tanji, T."}], "nameIdentifiers": [{"nameIdentifier": "24016", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hibino, M."}], "nameIdentifiers": [{"nameIdentifier": "24017", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-19"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "Tanji_T_Effects_of_Fresnel_Corrections_for_Phase-Shifting_Electron_Holography_2002.pdf", "filesize": [{"value": "204.2 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 204200.0, "url": {"label": "Tanji_T_Effects_of_Fresnel_Corrections_for_Phase-Shifting_Electron_Holography_2002.pdf", "url": "https://nagoya.repo.nii.ac.jp/record/8546/files/Tanji_T_Effects_of_Fresnel_Corrections_for_Phase-Shifting_Electron_Holography_2002.pdf"}, "version_id": "1526dacc-e707-4b42-b205-e264443eef2e"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Effects of Fresnel Corrections for Phase-Shifting Electron Holography", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Effects of Fresnel Corrections for Phase-Shifting Electron Holography"}]}, "item_type_id": "10", "owner": "1", "path": ["320/321/322"], "permalink_uri": "http://hdl.handle.net/2237/10294", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_value": "2008-07-30"}, "publish_date": "2008-07-30", "publish_status": "0", "recid": "8546", "relation": {}, "relation_version_is_last": true, "title": ["Effects of Fresnel Corrections for Phase-Shifting Electron Holography"], "weko_shared_id": null}