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  1. A500 情報学部/情報学研究科・情報文化学部・情報科学研究科
  2. A500e 会議資料
  3. 国際会議

Level-Testability of Multi-operand Adders

http://hdl.handle.net/2237/12025
http://hdl.handle.net/2237/12025
94d04930-f86c-43cf-8b48-83a8313b4a41
名前 / ファイル ライセンス アクション
Takagi.pdf Takagi.pdf (539.1 kB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2009-08-04
タイトル
タイトル Level-Testability of Multi-operand Adders
言語 en
著者 Kito, Nobutaka

× Kito, Nobutaka

WEKO 30890

en Kito, Nobutaka

Search repository
Takagi, Naofumi

× Takagi, Naofumi

WEKO 30891

en Takagi, Naofumi

Search repository
アクセス権
アクセス権 open access
アクセス権URI http://purl.org/coar/access_right/c_abf2
権利
言語 en
権利情報 Copyright © 2008 IEEE. Reprinted from IEEE 17th Asian Test Symposium, 2008, p.257-260. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University's products or services. Internal or personal use of this material is permitted. <br/>However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.
抄録
内容記述 Level-testability of multi-operand adders consisting of carry save adders is shown by showing test design for them. A multi-operand adder is a main part of a multiplier. 6L + 2patterns are sufficient to test a multi-operand adder under cell fault model, where L denotes the depth of the multi-operand adder. A test method of the multi-operand adder used as a partial product compressor in a multiplier is also shown. This result gives an upper bound of the number of required test patterns for a multi-operand adder in any multiplier.
言語 en
内容記述タイプ Abstract
出版者
言語 en
出版者 IEEE
言語
言語 eng
資源タイプ
資源タイプresource http://purl.org/coar/resource_type/c_6501
タイプ journal article
出版タイプ
出版タイプ VoR
出版タイプResource http://purl.org/coar/version/c_970fb48d4fbd8a85
DOI
関連タイプ isVersionOf
識別子タイプ DOI
関連識別子 https://doi.org/10.1109/ATS.2008.40
書誌情報 en : 17th Asian Test Symposium IEEE

p. 257-260, 発行日 2008-11
フォーマット
application/pdf
著者版フラグ
値 publisher
URI
識別子 http://dx.doi.org/10.1109/ATS.2008.40
識別子タイプ DOI
URI
識別子 http://hdl.handle.net/2237/12025
識別子タイプ HDL
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