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Level-Testability of Multi-operand Adders
http://hdl.handle.net/2237/12025
http://hdl.handle.net/2237/1202594d04930-f86c-43cf-8b48-83a8313b4a41
名前 / ファイル | ライセンス | アクション |
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Takagi.pdf (539.1 kB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2009-08-04 | |||||
タイトル | ||||||
タイトル | Level-Testability of Multi-operand Adders | |||||
言語 | en | |||||
著者 |
Kito, Nobutaka
× Kito, Nobutaka× Takagi, Naofumi |
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アクセス権 | ||||||
アクセス権 | open access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_abf2 | |||||
権利 | ||||||
言語 | en | |||||
権利情報 | Copyright © 2008 IEEE. Reprinted from IEEE 17th Asian Test Symposium, 2008, p.257-260. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University's products or services. Internal or personal use of this material is permitted. <br/>However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. | |||||
抄録 | ||||||
内容記述 | Level-testability of multi-operand adders consisting of carry save adders is shown by showing test design for them. A multi-operand adder is a main part of a multiplier. 6L + 2patterns are sufficient to test a multi-operand adder under cell fault model, where L denotes the depth of the multi-operand adder. A test method of the multi-operand adder used as a partial product compressor in a multiplier is also shown. This result gives an upper bound of the number of required test patterns for a multi-operand adder in any multiplier. | |||||
言語 | en | |||||
内容記述タイプ | Abstract | |||||
出版者 | ||||||
言語 | en | |||||
出版者 | IEEE | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプresource | http://purl.org/coar/resource_type/c_6501 | |||||
タイプ | journal article | |||||
出版タイプ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
DOI | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | DOI | |||||
関連識別子 | https://doi.org/10.1109/ATS.2008.40 | |||||
書誌情報 |
en : 17th Asian Test Symposium IEEE p. 257-260, 発行日 2008-11 |
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application/pdf | ||||||
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値 | publisher | |||||
URI | ||||||
識別子 | http://dx.doi.org/10.1109/ATS.2008.40 | |||||
識別子タイプ | DOI | |||||
URI | ||||||
識別子 | http://hdl.handle.net/2237/12025 | |||||
識別子タイプ | HDL |