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{"_buckets": {"deposit": "ec033a6e-10bf-421d-8d0d-7e6fd372f811"}, "_deposit": {"id": "10310", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "10310"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00010310", "sets": ["503"]}, "author_link": ["31257", "31258", "31259", "31260", "31261", "31262"], "item_10_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2008-10", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "378", "bibliographicPageStart": "375", "bibliographic_titles": [{"bibliographic_title": "Annual Report Conference on Electrical Insulation and Dielectric Phenomena (CEIDP 2008)", "bibliographic_titleLang": "en"}]}]}, "item_10_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "This paper discusses the partial discharge (PD) resistant mechanism of nanocomposite enamel wires under repetitive surge voltage condition for inverter-fed motors. We focused on the reduction of deterioration depth and the surface condition of nanocomposite enamel wires after repetitive surge voltage application with successive PD. Experimental results revealed that the longer lifetime of breakdown of nanocomposite enamel  wires compared with the conventional wires would be brought about not only by the filled nano materials, but also by their byproduct on the enamel surface under repetitive PD generation. The erosion of nanocomposite enamel layers was suppressed in depth by the byproduct and dispersed in the longitudinal direction along the enamel surface, which could contribute to the longer lifetime of breakdown than conventional wires.", "subitem_description_language": "en", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "DOI", "subitem_identifier_uri": "http://dx.doi.org/10.1109/CEIDP.2008.4772764"}, {"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/12130"}]}, "item_10_publisher_32": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "IEEE", "subitem_publisher_language": "en"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://doi.org/10.1109/CEIDP.2008.4772764", "subitem_relation_type_select": "DOI"}}]}, "item_10_rights_12": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright © 2008 IEEE. Reprinted from Annual Report Conference on Electrical Insulation and Dielectric Phenomena, 2008. CEIDP 2008. p.375-378.\u003cbr/\u003eThis material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.", "subitem_rights_language": "en"}]}, "item_10_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "author"}]}, "item_10_text_14": {"attribute_name": "フォーマット", "attribute_value_mlt": [{"subitem_text_value": "application/pdf"}]}, "item_1615787544753": {"attribute_name": "出版タイプ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_ab4af688f83e57aa", "subitem_version_type": "AM"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "open access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_abf2"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Nakamura, Yusuke", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "31257", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Inano, Hiroshi", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "31258", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hiroshima, Satoshi", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "31259", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hirose, Tatsuya", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "31260", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hamaguchi, Masahiro", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "31261", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Okubo, Hitoshi", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "31262", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-20"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "CEIDP-1.pdf", "filesize": [{"value": "884.4 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_note", "mimetype": "application/pdf", "size": 884400.0, "url": {"label": "CEIDP-1.pdf", "objectType": "fulltext", "url": "https://nagoya.repo.nii.ac.jp/record/10310/files/CEIDP-1.pdf"}, "version_id": "6090a5e8-6e16-4686-857f-c53826d9b810"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Partial Discharge Resistant Aging Mechanism of Nanocomposite Enamel Wires under Repetitive Surge Voltage Condition", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Partial Discharge Resistant Aging Mechanism of Nanocomposite Enamel Wires under Repetitive Surge Voltage Condition", "subitem_title_language": "en"}]}, "item_type_id": "10", "owner": "1", "path": ["503"], "permalink_uri": "http://hdl.handle.net/2237/12130", "pubdate": {"attribute_name": "PubDate", "attribute_value": "2009-08-31"}, "publish_date": "2009-08-31", "publish_status": "0", "recid": "10310", "relation": {}, "relation_version_is_last": true, "title": ["Partial Discharge Resistant Aging Mechanism of Nanocomposite Enamel Wires under Repetitive Surge Voltage Condition"], "weko_shared_id": -1}
  1. B200 工学部/工学研究科
  2. B200e 会議資料
  3. 国際会議

Partial Discharge Resistant Aging Mechanism of Nanocomposite Enamel Wires under Repetitive Surge Voltage Condition

http://hdl.handle.net/2237/12130
http://hdl.handle.net/2237/12130
cfb17878-2c8a-4ec7-ae35-76f4798d026b
名前 / ファイル ライセンス アクション
CEIDP-1.pdf CEIDP-1.pdf (884.4 kB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2009-08-31
タイトル
タイトル Partial Discharge Resistant Aging Mechanism of Nanocomposite Enamel Wires under Repetitive Surge Voltage Condition
言語 en
著者 Nakamura, Yusuke

× Nakamura, Yusuke

WEKO 31257

en Nakamura, Yusuke

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Inano, Hiroshi

× Inano, Hiroshi

WEKO 31258

en Inano, Hiroshi

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Hiroshima, Satoshi

× Hiroshima, Satoshi

WEKO 31259

en Hiroshima, Satoshi

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Hirose, Tatsuya

× Hirose, Tatsuya

WEKO 31260

en Hirose, Tatsuya

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Hamaguchi, Masahiro

× Hamaguchi, Masahiro

WEKO 31261

en Hamaguchi, Masahiro

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Okubo, Hitoshi

× Okubo, Hitoshi

WEKO 31262

en Okubo, Hitoshi

Search repository
アクセス権
アクセス権 open access
アクセス権URI http://purl.org/coar/access_right/c_abf2
権利
言語 en
権利情報 Copyright © 2008 IEEE. Reprinted from Annual Report Conference on Electrical Insulation and Dielectric Phenomena, 2008. CEIDP 2008. p.375-378.<br/>This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.
抄録
内容記述 This paper discusses the partial discharge (PD) resistant mechanism of nanocomposite enamel wires under repetitive surge voltage condition for inverter-fed motors. We focused on the reduction of deterioration depth and the surface condition of nanocomposite enamel wires after repetitive surge voltage application with successive PD. Experimental results revealed that the longer lifetime of breakdown of nanocomposite enamel wires compared with the conventional wires would be brought about not only by the filled nano materials, but also by their byproduct on the enamel surface under repetitive PD generation. The erosion of nanocomposite enamel layers was suppressed in depth by the byproduct and dispersed in the longitudinal direction along the enamel surface, which could contribute to the longer lifetime of breakdown than conventional wires.
言語 en
内容記述タイプ Abstract
出版者
言語 en
出版者 IEEE
言語
言語 eng
資源タイプ
資源タイプresource http://purl.org/coar/resource_type/c_6501
タイプ journal article
出版タイプ
出版タイプ AM
出版タイプResource http://purl.org/coar/version/c_ab4af688f83e57aa
DOI
関連タイプ isVersionOf
識別子タイプ DOI
関連識別子 https://doi.org/10.1109/CEIDP.2008.4772764
書誌情報 en : Annual Report Conference on Electrical Insulation and Dielectric Phenomena (CEIDP 2008)

p. 375-378, 発行日 2008-10
フォーマット
application/pdf
著者版フラグ
値 author
URI
識別子 http://dx.doi.org/10.1109/CEIDP.2008.4772764
識別子タイプ DOI
URI
識別子 http://hdl.handle.net/2237/12130
識別子タイプ HDL
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