WEKO3
アイテム
{"_buckets": {"deposit": "f7122db5-8d8c-436a-bd1a-ab3ac256043c"}, "_deposit": {"id": "12066", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "12066"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00012066", "sets": ["322"]}, "author_link": ["38283", "38284", "38285", "38286", "38287"], "item_10_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2009-08", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "4", "bibliographicPageEnd": "1157", "bibliographicPageStart": "1150", "bibliographicVolumeNumber": "16", "bibliographic_titles": [{"bibliographic_title": "IEEE Transactions on Dielectrics and Electrical Insulation", "bibliographic_titleLang": "en"}]}]}, "item_10_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "The electrical insulation reliability of solid spacers in gas insulated switchgears (GISs) is an important issue to achieve a safe operation of such equipment. Among different phenomena, charge accumulation represents the most important matter that can degrade the overall performance of these insulation systems. For this respect, this paper discusses the contribution of partial discharge (PD) activity by ac voltage application to charge accumulation in the small gap at the electrode/epoxy interface as one of the weakest points in GIS solid spacers. The partial discharge inception voltages for non-accumulated charge case (PDIV0) and after exposing to PD activity (PDIVn) are measured among different gap lengths, simulating delamination at the electrode/epoxy interface. The PD activity is generated using applied voltage with 1.2à PDIV0 for all gap lengths examined in this study (50~500 ¿m). In these measurements, PDIV increased with increasing the number of PD pulses as a result of accumulated charges. The accumulated surface charge density is estimated using the boundary equations and is compared for the different gap lengths. The accumulated charge density was larger for the smaller gap lengths. Comparing PD parameters with accumulated charge density enabled us to identify that the number of negative and positive PD pulses is the main parameter that corresponds to charge accumulation process.", "subitem_description_language": "en", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/13944"}, {"subitem_identifier_type": "DOI", "subitem_identifier_uri": "http://dx.doi.org/10.1109/TDEI.2009.5211869"}]}, "item_10_publisher_32": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "IEEE", "subitem_publisher_language": "en"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://doi.org/10.1109/TDEI.2009.5211869", "subitem_relation_type_select": "DOI"}}]}, "item_10_rights_12": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "©2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.", "subitem_rights_language": "en"}]}, "item_10_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "1070-9878", "subitem_source_identifier_type": "PISSN"}]}, "item_10_text_14": {"attribute_name": "フォーマット", "attribute_value_mlt": [{"subitem_text_value": "application/pdf"}]}, "item_1615787544753": {"attribute_name": "出版タイプ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "open access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_abf2"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Mansour, Diaa-Eldin A.", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "38283", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kojima, Hiroki", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "38284", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hayakawa, Naoki", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "38285", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Endo, Fumihiro", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "38286", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Okubo, Hitoshi", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "38287", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-20"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "Surface_Charge.pdf", "filesize": [{"value": "634.7 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_note", "mimetype": "application/pdf", "size": 634700.0, "url": {"label": "Surface_Charge.pdf", "objectType": "fulltext", "url": "https://nagoya.repo.nii.ac.jp/record/12066/files/Surface_Charge.pdf"}, "version_id": "6bc37fa2-22b3-48b4-9788-60f6f834060d"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "Partial discharges", "subitem_subject_scheme": "Other"}, {"subitem_subject": "charge accumulation", "subitem_subject_scheme": "Other"}, {"subitem_subject": "electrode/epoxy interface", "subitem_subject_scheme": "Other"}, {"subitem_subject": "SF6 gas insulation systems", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Surface charge accumulation and partial discharge activity for small gaps of electrode/epoxy interface in sf6 gas", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Surface charge accumulation and partial discharge activity for small gaps of electrode/epoxy interface in sf6 gas", "subitem_title_language": "en"}]}, "item_type_id": "10", "owner": "1", "path": ["322"], "permalink_uri": "http://hdl.handle.net/2237/13944", "pubdate": {"attribute_name": "PubDate", "attribute_value": "2010-08-04"}, "publish_date": "2010-08-04", "publish_status": "0", "recid": "12066", "relation": {}, "relation_version_is_last": true, "title": ["Surface charge accumulation and partial discharge activity for small gaps of electrode/epoxy interface in sf6 gas"], "weko_shared_id": -1}
Surface charge accumulation and partial discharge activity for small gaps of electrode/epoxy interface in sf6 gas
http://hdl.handle.net/2237/13944
http://hdl.handle.net/2237/13944d7a3196a-3177-41a5-94b8-2ef76c300e65
名前 / ファイル | ライセンス | アクション |
---|---|---|
Surface_Charge.pdf (634.7 kB)
|
|
Item type | 学術雑誌論文 / Journal Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2010-08-04 | |||||
タイトル | ||||||
タイトル | Surface charge accumulation and partial discharge activity for small gaps of electrode/epoxy interface in sf6 gas | |||||
言語 | en | |||||
著者 |
Mansour, Diaa-Eldin A.
× Mansour, Diaa-Eldin A.× Kojima, Hiroki× Hayakawa, Naoki× Endo, Fumihiro× Okubo, Hitoshi |
|||||
アクセス権 | ||||||
アクセス権 | open access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_abf2 | |||||
権利 | ||||||
言語 | en | |||||
権利情報 | ©2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Partial discharges | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | charge accumulation | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | electrode/epoxy interface | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | SF6 gas insulation systems | |||||
抄録 | ||||||
内容記述 | The electrical insulation reliability of solid spacers in gas insulated switchgears (GISs) is an important issue to achieve a safe operation of such equipment. Among different phenomena, charge accumulation represents the most important matter that can degrade the overall performance of these insulation systems. For this respect, this paper discusses the contribution of partial discharge (PD) activity by ac voltage application to charge accumulation in the small gap at the electrode/epoxy interface as one of the weakest points in GIS solid spacers. The partial discharge inception voltages for non-accumulated charge case (PDIV0) and after exposing to PD activity (PDIVn) are measured among different gap lengths, simulating delamination at the electrode/epoxy interface. The PD activity is generated using applied voltage with 1.2à PDIV0 for all gap lengths examined in this study (50~500 ¿m). In these measurements, PDIV increased with increasing the number of PD pulses as a result of accumulated charges. The accumulated surface charge density is estimated using the boundary equations and is compared for the different gap lengths. The accumulated charge density was larger for the smaller gap lengths. Comparing PD parameters with accumulated charge density enabled us to identify that the number of negative and positive PD pulses is the main parameter that corresponds to charge accumulation process. | |||||
言語 | en | |||||
内容記述タイプ | Abstract | |||||
出版者 | ||||||
言語 | en | |||||
出版者 | IEEE | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプresource | http://purl.org/coar/resource_type/c_6501 | |||||
タイプ | journal article | |||||
出版タイプ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
DOI | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | DOI | |||||
関連識別子 | https://doi.org/10.1109/TDEI.2009.5211869 | |||||
ISSN | ||||||
収録物識別子タイプ | PISSN | |||||
収録物識別子 | 1070-9878 | |||||
書誌情報 |
en : IEEE Transactions on Dielectrics and Electrical Insulation 巻 16, 号 4, p. 1150-1157, 発行日 2009-08 |
|||||
フォーマット | ||||||
application/pdf | ||||||
著者版フラグ | ||||||
値 | publisher | |||||
URI | ||||||
識別子 | http://hdl.handle.net/2237/13944 | |||||
識別子タイプ | HDL | |||||
URI | ||||||
識別子 | http://dx.doi.org/10.1109/TDEI.2009.5211869 | |||||
識別子タイプ | DOI |