{"_buckets": {"deposit": "6e7953af-4944-446b-bfd0-cf366a24f927"}, "_deposit": {"id": "28614", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "28614"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00028614"}, "item_10_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2019-07", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "7", "bibliographicPageEnd": "877", "bibliographicPageStart": "867", "bibliographicVolumeNumber": "102", "bibliographic_titles": [{"bibliographic_title": "IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences"}]}]}, "item_10_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "Adaptive voltage scaling is a promising approach to overcome manufacturing variability, dynamic environmental fluctuation, and aging. This paper focuses on error prediction based adaptive voltage scaling (EP-AVS) and proposes a mean time to failure (MTTF) aware design methodology for EP-AVS circuits. Main contributions of this work include (1) optimization of both voltage-scaled circuit and voltage control logic, and (2) quantitative evaluation of power saving for practically long MTTF. Experimental results show that the proposed EP-AVS design methodology achieves 38.0% power saving while satisfying given target MTTF.", "subitem_description_type": "Abstract"}]}, "item_10_publisher_32": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "\u4e00\u822c\u793e\u56e3\u6cd5\u4eba \u96fb\u5b50\u60c5\u5831\u901a\u4fe1\u5b66\u4f1a"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "https://doi.org/10.1587/transfun.E102.A.867", "subitem_relation_type_select": "DOI"}}]}, "item_10_relation_41": {"attribute_name": "\u95a2\u4fc2URI", "attribute_value_mlt": [{"subitem_relation_name": [{"subitem_relation_name_text": "http://www.ieice.org/jpn/books/transaction.html "}]}]}, "item_10_rights_12": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "copyright\u00a92019 IEICE "}]}, "item_10_select_15": {"attribute_name": "\u8457\u8005\u7248\u30d5\u30e9\u30b0", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_source_id_61": {"attribute_name": "ISSN\uff08print\uff09", "attribute_value_mlt": [{"subitem_source_identifier": "0916-8508", "subitem_source_identifier_type": "ISSN"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "MASUDA, Yutaka"}], "nameIdentifiers": [{"nameIdentifier": "93691", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "HASHIMOTO, Masanori"}], "nameIdentifiers": [{"nameIdentifier": "93692", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-10-15"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "e102-a_7_867.pdf", "filesize": [{"value": "1.2 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 1200000.0, "url": {"label": "e102-a_7_867", "url": "https://nagoya.repo.nii.ac.jp/record/28614/files/e102-a_7_867.pdf"}, "version_id": "b5ca6d4d-3961-4095-9809-8782825123e7"}]}, "item_keyword": {"attribute_name": "\u30ad\u30fc\u30ef\u30fc\u30c9", "attribute_value_mlt": [{"subitem_subject": "adaptive voltage scaling", "subitem_subject_scheme": "Other"}, {"subitem_subject": "activation-aware slack assignment", "subitem_subject_scheme": "Other"}, {"subitem_subject": "mean time to failure", "subitem_subject_scheme": "Other"}, {"subitem_subject": "timing error predictive FF", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "MTTF-Aware Design Methodology of Adaptively Voltage Scaled Circuit with Timing Error Predictive Flip-Flop", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "MTTF-Aware Design Methodology of Adaptively Voltage Scaled Circuit with Timing Error Predictive Flip-Flop"}]}, "item_type_id": "10", "owner": "1", "path": ["312/313/314"], "permalink_uri": "http://hdl.handle.net/2237/00030805", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_name_i18n": "\u516c\u958b\u65e5", "attribute_value": "2019-10-15"}, "publish_date": "2019-10-15", "publish_status": "0", "recid": "28614", "relation": {}, "relation_version_is_last": true, "title": ["MTTF-Aware Design Methodology of Adaptively Voltage Scaled Circuit with Timing Error Predictive Flip-Flop"], "weko_shared_id": null}