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  1. F200 未来材料・システム研究所
  2. F200a 雑誌掲載論文
  3. 学術雑誌

Practical selection of emission lines of He I to determine the photon absorption rate

http://hdl.handle.net/2237/00030856
d2f2ef87-36db-4607-b7eb-e22dcc628b8f
名前 / ファイル ライセンス アクション
1_3548923.pdf 1_3548923 (443.9 kB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2019-11-07
タイトル
タイトル Practical selection of emission lines of He I to determine the photon absorption rate
著者 Kajita, Shin

× Kajita, Shin

WEKO 94101

Kajita, Shin

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Ohno, Noriyasu

× Ohno, Noriyasu

WEKO 94102

Ohno, Noriyasu

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権利
権利情報 Copyright 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing.The following article appeared in (Review of Scientific Instruments. v.82, n.2, 2011, p.023501) and may be found at (http://dx.doi.org/10.1063/1.3548923).
抄録
内容記述 A combination of helium line intensities and a collisional radiative model has been used to measure electron density and temperature. However, radiation trapping of resonance lines may disturb the measurements due to disturbances in the population distribution of helium atoms. In this study, we show that the principal contribution of radiation trapping in helium plasma can be evaluated by additionally measuring one or two specific line intensities from the singlet state. The inclusion of the effects of radiation trapping sufficiently compensates for anomalous increases in the electron density and temperature, and consequently yields proper values. An experiment was performed in the divertor simulator NAGDIS-II, and the method's validity was confirmed by comparing the spectroscopically obtained results and the values from the electrostatic probe method.
内容記述タイプ Abstract
出版者
出版者 AIP Publishing
言語
言語 eng
資源タイプ
資源タイプresource http://purl.org/coar/resource_type/c_6501
タイプ journal article
DOI
関連識別子
識別子タイプ DOI
関連識別子 https://doi.org/10.1063/1.3548923
ISSN(print)
収録物識別子タイプ ISSN
収録物識別子 0034-6748
書誌情報 Review of Scientific Instruments

巻 82, 号 2, p. 023501, 発行日 2011-02
著者版フラグ
値 publisher
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