{"_buckets": {"deposit": "f8d7cecd-a4c1-413b-a562-db21b4e19f29"}, "_deposit": {"id": "5376", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "5376"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00005376", "sets": ["675"]}, "author_link": ["13702", "13703", "13704"], "item_10_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1996-10-28", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "28", "bibliographicPageEnd": "2625", "bibliographicPageStart": "2623", "bibliographicVolumeNumber": "69", "bibliographic_titles": [{"bibliographic_title": "Applied Physics Letters", "bibliographic_titleLang": "en"}]}]}, "item_10_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "Differential microscopy is realized by conventional off-axis electron holography with an electron biprism behind the specimen. Two phase images reconstructed from two holograms which are obtained with slightly different potentials of the electron biprism are utilized to make a one-dimensional differential image. Polystyrene latex particles which are charged by electron irradiation are used to demonstrate that the differential image is independent of the distortion of a reference wave.", "subitem_description_language": "en", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/6981"}]}, "item_10_publisher_32": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "American Institute of Physics", "subitem_publisher_language": "en"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://doi.org/10.1063/1.117555", "subitem_relation_type_select": "DOI"}}]}, "item_10_rights_12": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright (1996) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.", "subitem_rights_language": "en"}]}, "item_10_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0003-6951", "subitem_source_identifier_type": "PISSN"}]}, "item_10_text_14": {"attribute_name": "フォーマット", "attribute_value_mlt": [{"subitem_text_value": "application/pdf"}]}, "item_1615787544753": {"attribute_name": "出版タイプ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "open access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_abf2"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Tanji, Takayoshi", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "13702", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Ru, Qingxin", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "13703", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Tonomura, Akira", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "13704", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-19"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "ApplPhysLett_69_2623.pdf", "filesize": [{"value": "267.7 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_note", "mimetype": "application/pdf", "size": 267700.0, "url": {"label": "ApplPhysLett_69_2623.pdf", "objectType": "fulltext", "url": "https://nagoya.repo.nii.ac.jp/record/5376/files/ApplPhysLett_69_2623.pdf"}, "version_id": "9d7db0c6-8c9a-47ec-8910-587efc11e1bb"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Differential microscopy by conventional electron off-axis holography", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Differential microscopy by conventional electron off-axis holography", "subitem_title_language": "en"}]}, "item_type_id": "10", "owner": "1", "path": ["675"], "permalink_uri": "http://hdl.handle.net/2237/6981", "pubdate": {"attribute_name": "PubDate", "attribute_value": "2006-10-19"}, "publish_date": "2006-10-19", "publish_status": "0", "recid": "5376", "relation": {}, "relation_version_is_last": true, "title": ["Differential microscopy by conventional electron off-axis holography"], "weko_shared_id": -1}