{"_buckets": {"deposit": "78c0ae74-40fd-4ac2-ac6d-a82a06f85b3b"}, "_deposit": {"id": "12276", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "12276"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00012276"}, "item_10_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2009-10", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "14", "bibliographicPageEnd": "144102", "bibliographicPageStart": "144102", "bibliographicVolumeNumber": "95", "bibliographic_titles": [{"bibliographic_title": "APPLIED PHYSICS LETTERS"}]}]}, "item_10_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "The evolution of silicon carbide (0001) surface reconstruction upon annealing has been studied by Si K edge extended x-ray absorption fine structure (EXAFS). Using Si KVV Auger electron yield at different emission angles with different surface sensitivities, EXAFS reveals conclusively that Si\u2013Si bonds exist on the surface for all reconstructions. The existence of Si clusters on the 6 square root of 3 \u00d7 6 square root of 3R30\u00b0 surface was also confirmed by x-ray photoemission spectroscopy. This finding gives us a better understanding of epitaxial graphene formation on SiC.", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/14156"}, {"subitem_identifier_type": "DOI", "subitem_identifier_uri": "http://dx.doi.org/10.1063/1.3242005"}]}, "item_10_publisher_32": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "American Institute of Physics"}]}, "item_10_rights_12": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "Copyright (2010) American Institute of Physics. This article may be downloaded for personal use only. 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T. S."}], "nameIdentifiers": [{"nameIdentifier": "38760", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Nomoto, T."}], "nameIdentifiers": [{"nameIdentifier": "38761", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Yagi, S."}], "nameIdentifiers": [{"nameIdentifier": "38762", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Soda, Kazuo"}], "nameIdentifiers": [{"nameIdentifier": "38763", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Yuhara, Junji"}], "nameIdentifiers": [{"nameIdentifier": "38764", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-20"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "APPLIED_PHYSICS_LETTERS_95_14_144102.pdf", "filesize": [{"value": "151.9 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 151900.0, "url": {"label": "APPLIED_PHYSICS_LETTERS_95_14_144102.pdf", "url": "https://nagoya.repo.nii.ac.jp/record/12276/files/APPLIED_PHYSICS_LETTERS_95_14_144102.pdf"}, "version_id": "5cac2545-aee1-4999-8d87-7472eb35f210"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Si clusters on reconstructed SiC (0001) revealed by surface extended x-ray absorption fine structure", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Si clusters on reconstructed SiC (0001) revealed by surface extended x-ray absorption fine structure"}]}, "item_type_id": "10", "owner": "1", "path": ["320/321/322"], "permalink_uri": "http://hdl.handle.net/2237/14156", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_value": "2010-09-16"}, "publish_date": "2010-09-16", "publish_status": "0", "recid": "12276", "relation": {}, "relation_version_is_last": true, "title": ["Si clusters on reconstructed SiC (0001) revealed by surface extended x-ray absorption fine structure"], "weko_shared_id": null}