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Field emission microscopy of Al-deposited carbon nanotubes: Emission stability improvement and image of an Al atom cluster
http://hdl.handle.net/2237/14164
http://hdl.handle.net/2237/14164d0928264-f292-468a-9994-543737145923
名前 / ファイル | ライセンス | アクション |
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2010-09-17 | |||||
タイトル | ||||||
タイトル | Field emission microscopy of Al-deposited carbon nanotubes: Emission stability improvement and image of an Al atom cluster | |||||
言語 | en | |||||
著者 |
Saito, Yahachi
× Saito, Yahachi× Matsukawa, Tomohiro× Asaka, Koji× Nakahara, Hitoshi |
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アクセス権 | ||||||
アクセス権 | open access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_abf2 | |||||
抄録 | ||||||
内容記述 | Aluminum (Al) was deposited on multiwall carbon nanotubes (MWNTs) with mean thicknesses ranging from 1 to 11 nm in vacuum, and the influence of deposited Al on field electron emission was investigated by field emission microscopy (FEM). Al deposition significantly suppressed the fluctuations of emission current after a simple conditioning process. Interestingly, FEM images revealing the atomic detail of an Al cluster with the cubo-octahedron structure were observed. The discussion on the spatial resolution in FEM for MWNTs suggests the probable observation of some atomic structures with a resolution of the order of 0.3 nm. | |||||
言語 | en | |||||
内容記述タイプ | Abstract | |||||
出版者 | ||||||
言語 | en | |||||
出版者 | American Institute of Physics | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプresource | http://purl.org/coar/resource_type/c_6501 | |||||
タイプ | journal article | |||||
出版タイプ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
ISSN | ||||||
収録物識別子タイプ | PISSN | |||||
収録物識別子 | 1071-1023 | |||||
書誌情報 |
en : Journal of Vacuum Science & Technology B 巻 28, 号 2, p. C2A5-C2A8, 発行日 2010-03 |
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application/pdf | ||||||
著者版フラグ | ||||||
値 | publisher | |||||
URI | ||||||
識別子 | http://hdl.handle.net/2237/14164 | |||||
識別子タイプ | HDL |