{"_buckets": {"deposit": "6f0dc4a4-5ee4-4b2e-8318-c265682e33bd"}, "_deposit": {"id": "21444", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "21444"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00021444"}, "item_10_alternative_title_19": {"attribute_name": "\u305d\u306e\u4ed6\u306e\u8a00\u8a9e\u306e\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_alternative_title": "Photoemission Study of Chemical Bonding Features at Metal/GeO_2 Interfaces"}]}, "item_10_biblio_info_6": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2011-06-27", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "114", "bibliographicPageEnd": "68", "bibliographicPageStart": "63", "bibliographicVolumeNumber": "111", "bibliographic_titles": [{"bibliographic_title": "\u96fb\u5b50\u60c5\u5831\u901a\u4fe1\u5b66\u4f1a\u6280\u8853\u7814\u7a76\u5831\u544a. SDM, \u30b7\u30ea\u30b3\u30f3\u6750\u6599\u30fb\u30c7\u30d0\u30a4\u30b9"}]}]}, "item_10_description_4": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "\u71b1\u9178\u5316\u306b\u3088\u308a\u5f62\u6210\u3057\u305fGeO_2/Ge(100)\u754c\u9762\u304a\u3088\u3073\u91d1\u5c5e(Al,Au\u304a\u3088\u3073Pt)\u8584\u819c\u5f62\u6210\u5f8c\u306eGeO_2\u3068\u306e\u754c\u9762\u5316\u5b66\u7d50\u5408\u72b6\u614b\u3092XPS\u5206\u6790\u306b\u3088\u308a\u8a55\u4fa1\u3057\u305f\u3002\u5ba4\u6e29\u306eAl\u84b8\u7740\u306b\u304a\u3044\u3066\u3001GeO_2\u521d\u671f\u819c\u539a(\u003e\u301c1nm)\u306b\u95a2\u308f\u3089\u305a\u3001\u539a\u3055\u301c1nm\u7a0b\u5ea6GeO_2\u304c\u9084\u5143\u3055\u308c\u308b\u3053\u3068\u304c\u660e\u3089\u304b\u306b\u306a\u3063\u305f\u3002\u521d\u671fGeO_2\u819c\u539a\u304c1.0nm\u7a0b\u5ea6\u306e\u5834\u5408\u306b\u306fGeO_2\u304b\u3089Al\u3078\u306e\u9178\u7d20\u539f\u5b50\u306e\u62e1\u6563\u304c\u652f\u914d\u7684\u3067\u3042\u308a\u3001GeO_2\u819c\u539a\u304c1.9nm\u4ee5\u4e0a\u306e\u5834\u5408\u306f\u9178\u7d20\u539f\u5b50\u62e1\u6563\u306b\u52a0\u3048\u3066Al-Ge\u7d50\u5408\u306e\u5f62\u6210\u304c\u660e\u77ad\u306b\u89b3\u6e2c\u3055\u308c\u305f\u3002\u307e\u305f\u3001\u6975\u8584Au\u304a\u3088\u3073Pt\u3092\u71b1\u9178\u5316GeO_2\u4e0a\u306b\u5806\u7a4d\u3057\u305f\u5834\u5408\u3001\u91d1\u5c5e/GeO_2\u754c\u9762\u306b\u71b1\u9178\u5316GeO_2/Ge\u754c\u9762\u3068\u540c\u7b49\u91cf\u306e\u30b5\u30d6\u30aa\u30ad\u30b5\u30a4\u30c9\u6210\u5206(GeO_x:0\u003cx\u003c2)\u306e\u5f62\u6210\u3092\u78ba\u8a8d\u3057\u305f\u3002We have investigated chemical bonding features at thermally-grown GeO_2/Ge(100) and metals (Al, Au and Pt)/GeO_2 interfaces by using high-resolution X-ray photoelectron spectroscopy (XPS). After the Al evaporation on GeO_2 thicker than 1.9nm initially, a reduction of GeO_2 accompanied with the generation of Al-Ge bonds was observed near the interface between Al and GeO_2. From the deconvolution of measured Ge3ds/2 spectra taken after physical vapor deposition of Au- and Pt-ultrathin films on thermally-grown GeO_2, we have confirmed the formation of Ge sub-oxide components (GeO_x 0\u003cx\u003c2) at the metal/GeO_2 interfaces being quantitatively comparable to sub-oxides at the thermally-grown GeO_2/Ge(100) interface.", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "URI", "subitem_identifier_uri": "http://ci.nii.ac.jp/naid/110008800857/"}, {"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/23574"}]}, "item_10_publisher_32": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "\u4e00\u822c\u793e\u56e3\u6cd5\u4eba\u96fb\u5b50\u60c5\u5831\u901a\u4fe1\u5b66\u4f1a"}]}, "item_10_rights_12": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": 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