{"_buckets": {"deposit": "ca27e0a7-1284-41f2-9e8a-c7ca27dbc7ac"}, "_deposit": {"id": "5568", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "5568"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00005568", "sets": ["322"]}, "author_link": ["14485", "14486", "14487", "14488", "14489"], "item_10_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2002-04", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "1428", "bibliographicPageStart": "1423", "bibliographic_titles": [{"bibliographic_title": "Proceedings of the Power Conversion Conference (PCC Osaka 2002)", "bibliographic_titleLang": "en"}]}]}, "item_10_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "Calculations were carried out to study the effect of a semiconductor type of fault current limiter (FCL) upon the interrupting duty imposed on a circuit breaker when a fault occurs at a distance of 1 to 8 km downstream from the load side terminals of the FCL. For comparison purpose, we also look at the interrupting condition when the fault happens very close to the terminals of the circuit breaker The semiconductor type of FCL in current-limiting operation was assumed to have a limiting element composed of either an inductance or a resistance. For all fault locations, the insertion of the resistive FCL proved to decrease not only the fault current, but also the rate of rise of the recovery voltage (rrrv). For the inductive FCL, the rrrv depends mainly upon the stray capacitance Cp of the limiting coil. Under short-line fault (SLF) condition, the introduction of the inductive FCL with Cp=100 nF is shown to reduce the severity of the SLF transient by reducing the fault current and the rrrv. However for all fault locations, the insertion of the inductive FCL with Cp =10 nF was found to decrease the fault current, while increasing the rrrv.", "subitem_description_language": "en", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/7174"}]}, "item_10_publisher_32": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "IEEE", "subitem_publisher_language": "en"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://doi.org/10.1109/PCC.2002.998182", "subitem_relation_type_select": "DOI"}}]}, "item_10_relation_8": {"attribute_name": "ISBN", "attribute_value_mlt": [{"subitem_relation_type": "isPartOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "0-7803-7156-9", "subitem_relation_type_select": "ISBN"}}]}, "item_10_rights_12": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright © 2002 IEEE. Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.", "subitem_rights_language": "en"}]}, "item_10_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_text_14": {"attribute_name": "フォーマット", "attribute_value_mlt": [{"subitem_text_value": "application/pdf"}]}, "item_1615787544753": {"attribute_name": "出版タイプ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "open access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_abf2"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Calixte, Evenson", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "14485", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Yokomizu, Yasunobu", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "14486", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Shimizu, Hirotaka", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "14487", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Matsumura, Toshiro", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "14488", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Fujita, Hideki", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "14489", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-19"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "PCC_2002_1423.pdf", "filesize": [{"value": "644.9 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_note", "mimetype": "application/pdf", "size": 644900.0, "url": {"label": "PCC_2002_1423.pdf", "objectType": "fulltext", "url": "https://nagoya.repo.nii.ac.jp/record/5568/files/PCC_2002_1423.pdf"}, "version_id": "e5d9fef6-cd7f-4006-99ac-544effbc1ba8"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "Fault current limiter", "subitem_subject_scheme": "Other"}, {"subitem_subject": "circuit breaker", "subitem_subject_scheme": "Other"}, {"subitem_subject": "transient recovery voltage", "subitem_subject_scheme": "Other"}, {"subitem_subject": "interrupting duty", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Reduction Effect of Semiconductor Type Fault Current Limiter on Interrupting Duty of a Circuit Breaker", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Reduction Effect of Semiconductor Type Fault Current Limiter on Interrupting Duty of a Circuit Breaker", "subitem_title_language": "en"}]}, "item_type_id": "10", "owner": "1", "path": ["322"], "permalink_uri": "http://hdl.handle.net/2237/7174", "pubdate": {"attribute_name": "PubDate", "attribute_value": "2006-12-13"}, "publish_date": "2006-12-13", "publish_status": "0", "recid": "5568", "relation": {}, "relation_version_is_last": true, "title": ["Reduction Effect of Semiconductor Type Fault Current Limiter on Interrupting Duty of a Circuit Breaker"], "weko_shared_id": -1}