{"_buckets": {"deposit": "536645f8-361e-4a34-9814-136b4d0d4005"}, "_deposit": {"id": "5644", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "5644"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00005644", "sets": ["322"]}, "author_link": ["14921", "14922", "14923"], "item_10_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2002-04-29", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "17", "bibliographicPageEnd": "3068", "bibliographicPageStart": "3066", "bibliographicVolumeNumber": "80", "bibliographic_titles": [{"bibliographic_title": "Applied Physics Letters", "bibliographic_titleLang": "en"}]}]}, "item_10_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "A thermal probe for plasma diagnostics is introduced. The method is based upon measuring the equilibrium temperature of a conducting sphere as a function of its applied bias. The resulting temperature–voltage characteristic is processed using a theoretical model that accounts for charge and thermodynamic balance. The thermal probe is capable of detecting negative ions and shows sensitivity to certain chemical reactions. Measurements performed in Ar, Ar/SF_6, and O_2 show good agreement among the plasma parameters using thermal and Langmuir probes.", "subitem_description_language": "en", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/7250"}]}, "item_10_publisher_32": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "American Institute of Physics", "subitem_publisher_language": "en"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://doi.org/10.1063/1.1473688", "subitem_relation_type_select": "DOI"}}]}, "item_10_rights_12": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright (2002) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.", "subitem_rights_language": "en"}]}, "item_10_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0003-6951", "subitem_source_identifier_type": "PISSN"}]}, "item_10_text_14": {"attribute_name": "フォーマット", "attribute_value_mlt": [{"subitem_text_value": "application/pdf"}]}, "item_1615787544753": {"attribute_name": "出版タイプ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "open access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_abf2"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Stamate, E.", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "14921", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Sugai, H.", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "14922", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Ohe, K.", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "14923", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-19"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "ApplPhysLett_80_3066.pdf", "filesize": [{"value": "171.6 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_note", "mimetype": "application/pdf", "size": 171600.0, "url": {"label": "ApplPhysLett_80_3066.pdf", "objectType": "fulltext", "url": "https://nagoya.repo.nii.ac.jp/record/5644/files/ApplPhysLett_80_3066.pdf"}, "version_id": "e4d993cc-3c24-4730-a6aa-3d2bceebfc2c"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Principle and application of a thermal probe to reactive plasmas", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Principle and application of a thermal probe to reactive plasmas", "subitem_title_language": "en"}]}, "item_type_id": "10", "owner": "1", "path": ["322"], "permalink_uri": "http://hdl.handle.net/2237/7250", "pubdate": {"attribute_name": "PubDate", "attribute_value": "2007-01-15"}, "publish_date": "2007-01-15", "publish_status": "0", "recid": "5644", "relation": {}, "relation_version_is_last": true, "title": ["Principle and application of a thermal probe to reactive plasmas"], "weko_shared_id": -1}