{"_buckets": {"deposit": "4cef58e3-92a8-44dd-93da-f59a51270f55"}, "_deposit": {"id": "7094", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "7094"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00007094", "sets": ["322"]}, "author_link": ["19154", "19155", "19156", "19157", "19158"], "item_10_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2006-10-09", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "15", "bibliographicPageEnd": "153502", "bibliographicPageStart": "153502", "bibliographicVolumeNumber": "89", "bibliographic_titles": [{"bibliographic_title": "APPLIED PHYSICS LETTERS", "bibliographic_titleLang": "en"}]}]}, "item_10_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "The authors have performed a depth-profile analysis of an all-oxide p-n junction diode n-ZnO/ p-NiO using photoemission spectroscopy combined with Ar-ion sputtering. Systematic core-level shifts were observed during the gradual removal of the ZnO overlayer, and were interpreted using a model based on charge conservation. Spatial profile of the potential around the interface was deduced, including the charge-depletion width of 2.3 nm extending on the ZnO side and the built-in potential of 0.54 eV.", "subitem_description_language": "en", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/8768"}]}, "item_10_publisher_32": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "American Institute of Physics", "subitem_publisher_language": "en"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://doi.org/10.1063/1.2358858", "subitem_relation_type_select": "DOI"}}]}, "item_10_rights_12": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright (2006) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.", "subitem_rights_language": "en"}]}, "item_10_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "publisher"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0003-6951", "subitem_source_identifier_type": "PISSN"}]}, "item_10_text_14": {"attribute_name": "フォーマット", "attribute_value_mlt": [{"subitem_text_value": "application/pdf"}]}, "item_1615787544753": {"attribute_name": "出版タイプ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "open access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_abf2"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Ishida, Yukiaki", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "19154", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Fujimori, Atsushi", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "19155", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Ohta, Hiromichi", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "19156", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hirano, Masahiro", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "19157", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hosono, Hideo", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "19158", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-19"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "AppPhysLett_89-153502.pdf", "filesize": [{"value": "926.3 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_note", "mimetype": "application/pdf", "size": 926300.0, "url": {"label": "AppPhysLett_89-153502.pdf", "objectType": "fulltext", "url": "https://nagoya.repo.nii.ac.jp/record/7094/files/AppPhysLett_89-153502.pdf"}, "version_id": "8c4b268a-56ad-491d-ac24-982ff595cc95"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Potential profiling of the nanometer-scale charge-depletion layer in n-ZnO/p-NiO junction using photoemission spectroscopy", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Potential profiling of the nanometer-scale charge-depletion layer in n-ZnO/p-NiO junction using photoemission spectroscopy", "subitem_title_language": "en"}]}, "item_type_id": "10", "owner": "1", "path": ["322"], "permalink_uri": "http://hdl.handle.net/2237/8768", "pubdate": {"attribute_name": "PubDate", "attribute_value": "2007-09-21"}, "publish_date": "2007-09-21", "publish_status": "0", "recid": "7094", "relation": {}, "relation_version_is_last": true, "title": ["Potential profiling of the nanometer-scale charge-depletion layer in n-ZnO/p-NiO junction using photoemission spectroscopy"], "weko_shared_id": -1}